Müller, A., Swaraj, S., Sparnacci, K., & Unger, W. (2018). Shell thickness determination for PTFE‐PS core‐shell nanoparticles using scanning transmission X‐ray microscopy (STXM). Surface & Interface Analysis: SIA, 50(11), 1077. https://doi.org/10.1002/sia.6464
Chicago Style (17th ed.) CitationMüller, A., S. Swaraj, K. Sparnacci, and W.E.S Unger. "Shell Thickness Determination for PTFE‐PS Core‐shell Nanoparticles Using Scanning Transmission X‐ray Microscopy (STXM)." Surface & Interface Analysis: SIA 50, no. 11 (2018): 1077. https://doi.org/10.1002/sia.6464.
MLA (9th ed.) CitationMüller, A., et al. "Shell Thickness Determination for PTFE‐PS Core‐shell Nanoparticles Using Scanning Transmission X‐ray Microscopy (STXM)." Surface & Interface Analysis: SIA, vol. 50, no. 11, 2018, p. 1077, https://doi.org/10.1002/sia.6464.