Radiative Characteristics of Reversed Polarity Gas-Puff Ar and Kr Plasmas.

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Title: Radiative Characteristics of Reversed Polarity Gas-Puff Ar and Kr Plasmas.
Authors: Shlyaptseva, Veronica, Takasugi, Keiichi, Shikone, Takashi, Hakamatsuka, Shun, Kantsyrev, Victor L., Safronova, Alla S., Petkov, Emil E., Gill, Amandeep K.
Source: IEEE Transactions on Plasma Science. Nov2018, Vol. 46 Issue 11, Part 1, p3842-3848. 7p.
Subjects: Electrodes, Plasma gases, Scanning electron microscopy, Electromagnetic waves, Nanoparticles, Electrons
Abstract: Experiments with regular and reversed polarities were carried out on the SHOTGUN-III Z-pinch device at Nihon University, Japan. SHOTGUN’s storage section consists of the 12- $\mu \text{F}$ fast capacitor bank, which was charged to 25 kV for these experiments and provided current up to 200 kA. The Ar and Kr gases were puffed between the electrodes through a hollow nozzle using a fast gas valve. Time-resolved X-ray detectors, time-integrated X-ray pinhole camera and two spectrometers, and an optical framing camera were applied for the study of radiative properties of Ar and Kr gas puffs. K-shell Ar spectra (3.9–4.2 Å) and L-shell Kr spectra (6.3–7.6 Å) show much intense He- and Li-like Ar and Ne- and Na-like Kr spectral features, respectively, and the evidence of the electron beams in reversed polarity experiments. The influence of reversed polarity on gas-puff plasma radiative characteristics and X-ray spectroscopic measurements is discussed. The advantages of using K-shell Ar and L-shell Kr for hot electron beam diagnostics are highlighted. [ABSTRACT FROM AUTHOR]
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  Data: Radiative Characteristics of Reversed Polarity Gas-Puff Ar and Kr Plasmas.
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Plasma+Science%22">IEEE Transactions on Plasma Science</searchLink>. Nov2018, Vol. 46 Issue 11, Part 1, p3842-3848. 7p.
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  Data: <searchLink fieldCode="DE" term="%22Electrodes%22">Electrodes</searchLink><br /><searchLink fieldCode="DE" term="%22Plasma+gases%22">Plasma gases</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+electron+microscopy%22">Scanning electron microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Electromagnetic+waves%22">Electromagnetic waves</searchLink><br /><searchLink fieldCode="DE" term="%22Nanoparticles%22">Nanoparticles</searchLink><br /><searchLink fieldCode="DE" term="%22Electrons%22">Electrons</searchLink>
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  Data: Experiments with regular and reversed polarities were carried out on the SHOTGUN-III Z-pinch device at Nihon University, Japan. SHOTGUN’s storage section consists of the 12- $\mu \text{F}$ fast capacitor bank, which was charged to 25 kV for these experiments and provided current up to 200 kA. The Ar and Kr gases were puffed between the electrodes through a hollow nozzle using a fast gas valve. Time-resolved X-ray detectors, time-integrated X-ray pinhole camera and two spectrometers, and an optical framing camera were applied for the study of radiative properties of Ar and Kr gas puffs. K-shell Ar spectra (3.9–4.2 Å) and L-shell Kr spectra (6.3–7.6 Å) show much intense He- and Li-like Ar and Ne- and Na-like Kr spectral features, respectively, and the evidence of the electron beams in reversed polarity experiments. The influence of reversed polarity on gas-puff plasma radiative characteristics and X-ray spectroscopic measurements is discussed. The advantages of using K-shell Ar and L-shell Kr for hot electron beam diagnostics are highlighted. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of IEEE Transactions on Plasma Science is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – SubjectFull: Scanning electron microscopy
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      – SubjectFull: Electromagnetic waves
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      – SubjectFull: Nanoparticles
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      – SubjectFull: Electrons
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              Text: Nov2018
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