Microwave Photonic Detector for Measuring Pulsed Electric Field Strengths in the Sub-Nanosecond Region.

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Title: Microwave Photonic Detector for Measuring Pulsed Electric Field Strengths in the Sub-Nanosecond Region.
Authors: Sukhov, A. V.1 sukhov@vniiofi.ru, Sakharov, K. Yu.1, Mikheev, O. V.1, Turkin, V. A.1, Ugolev, V. L.1, Denisov, M. Yu.1, Rodin, R. A.1
Source: Measurement Techniques. Sep2018, Vol. 61 Issue 6, p627-632. 6p.
Subjects: Photonics, Electric fields, Microwave photonics, Detectors, Measurement
Abstract: We provide a validated approach for microwave photonics as a means of developing high-speed noise-immune devices for measurement of strong pulsed electromagnetic fields. We develop a microwave photonic detector for measuring pulsed electric field strengths with a maximum transient-response rise time of 100 psec. [ABSTRACT FROM AUTHOR]
Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: We provide a validated approach for microwave photonics as a means of developing high-speed noise-immune devices for measurement of strong pulsed electromagnetic fields. We develop a microwave photonic detector for measuring pulsed electric field strengths with a maximum transient-response rise time of 100 psec. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Measurement Techniques is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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