APA (7th ed.) Citation

Thielen, M., Schaefer, F., Gruenewald, P., Laub, M., Marx, M., Meixner, M., . . . Motz, C. (2019). In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth. International Journal of Fatigue, 121, 155. https://doi.org/10.1016/j.ijfatigue.2018.12.013

Chicago Style (17th ed.) Citation

Thielen, M., F. Schaefer, P. Gruenewald, M. Laub, M. Marx, M. Meixner, M. Klaus, and C. Motz. "In Situ Synchrotron Stress Mappings to Characterize Overload Effects in Fatigue Crack Growth." International Journal of Fatigue 121 (2019): 155. https://doi.org/10.1016/j.ijfatigue.2018.12.013.

MLA (9th ed.) Citation

Thielen, M., et al. "In Situ Synchrotron Stress Mappings to Characterize Overload Effects in Fatigue Crack Growth." International Journal of Fatigue, vol. 121, 2019, p. 155, https://doi.org/10.1016/j.ijfatigue.2018.12.013.