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In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth.

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Title: In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth.
Authors: Thielen, M.1, Schaefer, F.1, Gruenewald, P.1, Laub, M.1, Marx, M.1 m.marx@matsci.uni-sb.de, Meixner, M.1, Klaus, M.1, Motz, C.1
Source: International Journal of Fatigue. Apr2019, Vol. 121, p155-162. 8p.
Subjects: Synchrotrons, Fatigue crack growth, Digital image correlation, Residual stresses, Fracture mechanics
Abstract: Graphical abstract Highlights • Clear experiment to measure crack tip stress fields at increasing load in synchrotron. • Fatigue specimens before and some cycles after a mechanical overload cycle. • Additionally, the stress fields have been measured in depth direction. • Completes conventional XRD or digital image correlation affected by surface effects. • The OL-sample with strong residual stress is related to the plastic zone of the OL. Abstract The dominant retardation mechanism of fatigue cracks after an overload is still under discussion for modeling variable amplitude loading. Is it plasticity induced crack closure in the wake of the crack or the residual stress field in the K-dominated region in front of the crack? Over the thickness, fracture mechanics changes from plane stress to plane strain and consequently observations in different depths are essential. This has been realized by synchrotron measurements. We found the residual stress effect to be more dominant while stress gradients over the thickness are hardly found for the residual but for the applied stresses. [ABSTRACT FROM AUTHOR]
Copyright of International Journal of Fatigue is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 135055323
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Thielen%2C+M%2E%22">Thielen, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Schaefer%2C+F%2E%22">Schaefer, F.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Gruenewald%2C+P%2E%22">Gruenewald, P.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Laub%2C+M%2E%22">Laub, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Marx%2C+M%2E%22">Marx, M.</searchLink><relatesTo>1</relatesTo><i> m.marx@matsci.uni-sb.de</i><br /><searchLink fieldCode="AR" term="%22Meixner%2C+M%2E%22">Meixner, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Klaus%2C+M%2E%22">Klaus, M.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Motz%2C+C%2E%22">Motz, C.</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22International+Journal+of+Fatigue%22">International Journal of Fatigue</searchLink>. Apr2019, Vol. 121, p155-162. 8p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Synchrotrons%22">Synchrotrons</searchLink><br /><searchLink fieldCode="DE" term="%22Fatigue+crack+growth%22">Fatigue crack growth</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+image+correlation%22">Digital image correlation</searchLink><br /><searchLink fieldCode="DE" term="%22Residual+stresses%22">Residual stresses</searchLink><br /><searchLink fieldCode="DE" term="%22Fracture+mechanics%22">Fracture mechanics</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Graphical abstract Highlights • Clear experiment to measure crack tip stress fields at increasing load in synchrotron. • Fatigue specimens before and some cycles after a mechanical overload cycle. • Additionally, the stress fields have been measured in depth direction. • Completes conventional XRD or digital image correlation affected by surface effects. • The OL-sample with strong residual stress is related to the plastic zone of the OL. Abstract The dominant retardation mechanism of fatigue cracks after an overload is still under discussion for modeling variable amplitude loading. Is it plasticity induced crack closure in the wake of the crack or the residual stress field in the K-dominated region in front of the crack? Over the thickness, fracture mechanics changes from plane stress to plane strain and consequently observations in different depths are essential. This has been realized by synchrotron measurements. We found the residual stress effect to be more dominant while stress gradients over the thickness are hardly found for the residual but for the applied stresses. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of International Journal of Fatigue is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1016/j.ijfatigue.2018.12.013
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 8
        StartPage: 155
    Subjects:
      – SubjectFull: Synchrotrons
        Type: general
      – SubjectFull: Fatigue crack growth
        Type: general
      – SubjectFull: Digital image correlation
        Type: general
      – SubjectFull: Residual stresses
        Type: general
      – SubjectFull: Fracture mechanics
        Type: general
    Titles:
      – TitleFull: In situ synchrotron stress mappings to characterize overload effects in fatigue crack growth.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Thielen, M.
      – PersonEntity:
          Name:
            NameFull: Schaefer, F.
      – PersonEntity:
          Name:
            NameFull: Gruenewald, P.
      – PersonEntity:
          Name:
            NameFull: Laub, M.
      – PersonEntity:
          Name:
            NameFull: Marx, M.
      – PersonEntity:
          Name:
            NameFull: Meixner, M.
      – PersonEntity:
          Name:
            NameFull: Klaus, M.
      – PersonEntity:
          Name:
            NameFull: Motz, C.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 04
              Text: Apr2019
              Type: published
              Y: 2019
          Identifiers:
            – Type: issn-print
              Value: 01421123
          Numbering:
            – Type: volume
              Value: 121
          Titles:
            – TitleFull: International Journal of Fatigue
              Type: main
ResultId 1