APA (7th ed.) Citation

Cheng, Y., Li, H., Wang, Y., & Li, X. (2019). Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 38(4), 767. https://doi.org/10.1109/TCAD.2018.2818690

Chicago Style (17th ed.) Citation

Cheng, Yun, Huawei Li, Ying Wang, and Xiaowei Li. "Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 38, no. 4 (2019): 767. https://doi.org/10.1109/TCAD.2018.2818690.

MLA (9th ed.) Citation

Cheng, Yun, et al. "Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug." IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 38, no. 4, 2019, p. 767, https://doi.org/10.1109/TCAD.2018.2818690.