Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug.
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| Title: | Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. |
|---|---|
| Authors: | Cheng, Yun1 chengyun@ict.ac.cn, Li, Huawei1 lihuawei@ict.ac.cn, Wang, Ying1 wangying2009@ict.ac.cn, Li, Xiaowei1 lxw@ict.ac.cn |
| Source: | IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Apr2019, Vol. 38 Issue 4, p767-779. 13p. |
| Subjects: | Computer debugging software, Debugging, Computer workstation clusters, Microsoft Windows (Operating system), Logic circuits |
| Abstract: | Trace signal selection is of great importance for post-silicon debug. Debuggers traditionally use state restoration to improve the observability of the trace data, and state restoration ratio (SRR) is computed after state restoration. In this paper, we exploit the combination of snapshot states and trace states to improve the observability. First, we propose a novel state restoration method, called cluster restoration. It uses both the snapshot states of flip-flop clusters at the beginning of tracing, and the tracing states of the clusters’ inputs during the tracing window to deterministically restore all states of these clusters during the tracing window. We also present a cluster restoration-based trace signal selection method to select clusters instead of trace signals directly, which includes two stages: 1) cluster generation and 2) cluster evaluation. For cluster generation, feedback loop-based cluster generation and backward tracing-based cluster generation techniques are proposed. For cluster evaluation, a new metric, called the global state restoration improvement is proposed to evaluate the candidate clusters. The experimental results show that in comparison to prior trace signal selection methods, our method can improve the SRR and reduce the runtime of trace signal selection as well. [ABSTRACT FROM AUTHOR] |
| Copyright of IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 135536842 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Cheng%2C+Yun%22">Cheng, Yun</searchLink><relatesTo>1</relatesTo><i> chengyun@ict.ac.cn</i><br /><searchLink fieldCode="AR" term="%22Li%2C+Huawei%22">Li, Huawei</searchLink><relatesTo>1</relatesTo><i> lihuawei@ict.ac.cn</i><br /><searchLink fieldCode="AR" term="%22Wang%2C+Ying%22">Wang, Ying</searchLink><relatesTo>1</relatesTo><i> wangying2009@ict.ac.cn</i><br /><searchLink fieldCode="AR" term="%22Li%2C+Xiaowei%22">Li, Xiaowei</searchLink><relatesTo>1</relatesTo><i> lxw@ict.ac.cn</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Computer-Aided+Design+of+Integrated+Circuits+%26+Systems%22">IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems</searchLink>. Apr2019, Vol. 38 Issue 4, p767-779. 13p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Computer+debugging+software%22">Computer debugging software</searchLink><br /><searchLink fieldCode="DE" term="%22Debugging%22">Debugging</searchLink><br /><searchLink fieldCode="DE" term="%22Computer+workstation+clusters%22">Computer workstation clusters</searchLink><br /><searchLink fieldCode="DE" term="%22Microsoft+Windows+%28Operating+system%29%22">Microsoft Windows (Operating system)</searchLink><br /><searchLink fieldCode="DE" term="%22Logic+circuits%22">Logic circuits</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Trace signal selection is of great importance for post-silicon debug. Debuggers traditionally use state restoration to improve the observability of the trace data, and state restoration ratio (SRR) is computed after state restoration. In this paper, we exploit the combination of snapshot states and trace states to improve the observability. First, we propose a novel state restoration method, called cluster restoration. It uses both the snapshot states of flip-flop clusters at the beginning of tracing, and the tracing states of the clusters’ inputs during the tracing window to deterministically restore all states of these clusters during the tracing window. We also present a cluster restoration-based trace signal selection method to select clusters instead of trace signals directly, which includes two stages: 1) cluster generation and 2) cluster evaluation. For cluster generation, feedback loop-based cluster generation and backward tracing-based cluster generation techniques are proposed. For cluster evaluation, a new metric, called the global state restoration improvement is proposed to evaluate the candidate clusters. The experimental results show that in comparison to prior trace signal selection methods, our method can improve the SRR and reduce the runtime of trace signal selection as well. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TCAD.2018.2818690 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 767 Subjects: – SubjectFull: Computer debugging software Type: general – SubjectFull: Debugging Type: general – SubjectFull: Computer workstation clusters Type: general – SubjectFull: Microsoft Windows (Operating system) Type: general – SubjectFull: Logic circuits Type: general Titles: – TitleFull: Cluster Restoration-Based Trace Signal Selection for Post-Silicon Debug. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Cheng, Yun – PersonEntity: Name: NameFull: Li, Huawei – PersonEntity: Name: NameFull: Wang, Ying – PersonEntity: Name: NameFull: Li, Xiaowei IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 04 Text: Apr2019 Type: published Y: 2019 Identifiers: – Type: issn-print Value: 02780070 Numbering: – Type: volume Value: 38 – Type: issue Value: 4 Titles: – TitleFull: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems Type: main |
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