View in EDS

Fast and Accurate Solution of the Inverse Problem for Image Reconstruction Using Electrical Impedance Tomography.

Saved in:
Bibliographic Details
Title: Fast and Accurate Solution of the Inverse Problem for Image Reconstruction Using Electrical Impedance Tomography.
Authors: Martin, Sebastien1 (AUTHOR) c.t.choi@ieee.org, Choi, Charles T. M.1 (AUTHOR)
Source: IEEE Transactions on Magnetics. Jun2019, Vol. 55 Issue 6, p1-4. 4p.
Subjects: Electrical impedance tomography, Inverse problems, Image reconstruction, Voltage, Artificial intelligence
Abstract: The goal in electrical impedance tomography is to obtain the electrical properties of different materials by applying an electrical current and measuring the resulting potential difference at the boundaries of the domain. While the numerical accuracy is technically limited by the size of the elements within the finite-element (FE) mesh, using a fine mesh will result in a computationally demanding reconstruction, especially when the region of interest (ROI) is not known. However, this situation is different when the location is known, when one can easily refine the FE model around the target, aiming for greater accuracy around the ROI. In this paper, an innovative approach estimates the location of the target object before solving the inverse problem, so that it becomes possible to refine only a specific area of the FE model. A powerful artificial intelligence method is used to obtain this region. [ABSTRACT FROM AUTHOR]
Copyright of IEEE Transactions on Magnetics is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 136509567
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Fast and Accurate Solution of the Inverse Problem for Image Reconstruction Using Electrical Impedance Tomography.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Martin%2C+Sebastien%22">Martin, Sebastien</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> c.t.choi@ieee.org</i><br /><searchLink fieldCode="AR" term="%22Choi%2C+Charles+T%2E+M%2E%22">Choi, Charles T. M.</searchLink><relatesTo>1</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Magnetics%22">IEEE Transactions on Magnetics</searchLink>. Jun2019, Vol. 55 Issue 6, p1-4. 4p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Electrical+impedance+tomography%22">Electrical impedance tomography</searchLink><br /><searchLink fieldCode="DE" term="%22Inverse+problems%22">Inverse problems</searchLink><br /><searchLink fieldCode="DE" term="%22Image+reconstruction%22">Image reconstruction</searchLink><br /><searchLink fieldCode="DE" term="%22Voltage%22">Voltage</searchLink><br /><searchLink fieldCode="DE" term="%22Artificial+intelligence%22">Artificial intelligence</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The goal in electrical impedance tomography is to obtain the electrical properties of different materials by applying an electrical current and measuring the resulting potential difference at the boundaries of the domain. While the numerical accuracy is technically limited by the size of the elements within the finite-element (FE) mesh, using a fine mesh will result in a computationally demanding reconstruction, especially when the region of interest (ROI) is not known. However, this situation is different when the location is known, when one can easily refine the FE model around the target, aiming for greater accuracy around the ROI. In this paper, an innovative approach estimates the location of the target object before solving the inverse problem, so that it becomes possible to refine only a specific area of the FE model. A powerful artificial intelligence method is used to obtain this region. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of IEEE Transactions on Magnetics is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=136509567
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1109/TMAG.2019.2900349
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 4
        StartPage: 1
    Subjects:
      – SubjectFull: Electrical impedance tomography
        Type: general
      – SubjectFull: Inverse problems
        Type: general
      – SubjectFull: Image reconstruction
        Type: general
      – SubjectFull: Voltage
        Type: general
      – SubjectFull: Artificial intelligence
        Type: general
    Titles:
      – TitleFull: Fast and Accurate Solution of the Inverse Problem for Image Reconstruction Using Electrical Impedance Tomography.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Martin, Sebastien
      – PersonEntity:
          Name:
            NameFull: Choi, Charles T. M.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 06
              Text: Jun2019
              Type: published
              Y: 2019
          Identifiers:
            – Type: issn-print
              Value: 00189464
          Numbering:
            – Type: volume
              Value: 55
            – Type: issue
              Value: 6
          Titles:
            – TitleFull: IEEE Transactions on Magnetics
              Type: main
ResultId 1