Revisiting reweighted robust standard deviation estimators for univariate Shewhart S‐charts.
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| Title: | Revisiting reweighted robust standard deviation estimators for univariate Shewhart S‐charts. |
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| Authors: | Mutlu, Ece Çiğdem1 (AUTHOR), Alakent, Burak1 (AUTHOR) burak.alakent@boun.edu.tr |
| Source: | Quality & Reliability Engineering International. Jun2019, Vol. 35 Issue 4, p995-1009. 15p. 4 Charts, 4 Graphs. |
| Subjects: | Gene expression, Crystal structure, Nanoparticles, Microstructure, Magnetic properties |
| Abstract: | Phase I outliers, unless screened during process parameter estimation, are known to deteriorate Phase II performance of process control charts. Reweighting estimators, ie, trimming outlier subgroups and individual observations, were suggested in the literature to improve both the robustness and efficiency of the resulting parameter estimates. In the current study, effects of various reweighted estimators at different trimming levels on the Phase II performance of S‐charts are elucidated using computer simulations including isolated and mixtures of contamination models. Outlier magnitudes in the simulations are held at a moderately low level to mimic industrial practice. Subtleties, such as varying Type I error rate among different trimming levels with respect to quantiles of dispersion estimates, prevent a single method to be revealed as the best performing one under all circumstances, and choice of estimators and trimming levels should depend on the number of subgroups in Phase I and the specifics of the process. Nevertheless, S‐chart using scale M‐estimator with logistic ρ and location M‐estimator at 2% trimming generally stands out in terms of Phase II performance, and high trimming levels are particularly recommended for high number of Phase I subgroups. [ABSTRACT FROM AUTHOR] |
| Copyright of Quality & Reliability Engineering International is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 136556488 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Revisiting reweighted robust standard deviation estimators for univariate Shewhart S‐charts. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Mutlu%2C+Ece+Çiğdem%22">Mutlu, Ece Çiğdem</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Alakent%2C+Burak%22">Alakent, Burak</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> burak.alakent@boun.edu.tr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Quality+%26+Reliability+Engineering+International%22">Quality & Reliability Engineering International</searchLink>. Jun2019, Vol. 35 Issue 4, p995-1009. 15p. 4 Charts, 4 Graphs. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Gene+expression%22">Gene expression</searchLink><br /><searchLink fieldCode="DE" term="%22Crystal+structure%22">Crystal structure</searchLink><br /><searchLink fieldCode="DE" term="%22Nanoparticles%22">Nanoparticles</searchLink><br /><searchLink fieldCode="DE" term="%22Microstructure%22">Microstructure</searchLink><br /><searchLink fieldCode="DE" term="%22Magnetic+properties%22">Magnetic properties</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Phase I outliers, unless screened during process parameter estimation, are known to deteriorate Phase II performance of process control charts. Reweighting estimators, ie, trimming outlier subgroups and individual observations, were suggested in the literature to improve both the robustness and efficiency of the resulting parameter estimates. In the current study, effects of various reweighted estimators at different trimming levels on the Phase II performance of S‐charts are elucidated using computer simulations including isolated and mixtures of contamination models. Outlier magnitudes in the simulations are held at a moderately low level to mimic industrial practice. Subtleties, such as varying Type I error rate among different trimming levels with respect to quantiles of dispersion estimates, prevent a single method to be revealed as the best performing one under all circumstances, and choice of estimators and trimming levels should depend on the number of subgroups in Phase I and the specifics of the process. Nevertheless, S‐chart using scale M‐estimator with logistic ρ and location M‐estimator at 2% trimming generally stands out in terms of Phase II performance, and high trimming levels are particularly recommended for high number of Phase I subgroups. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Quality & Reliability Engineering International is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/qre.2441 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 15 StartPage: 995 Subjects: – SubjectFull: Gene expression Type: general – SubjectFull: Crystal structure Type: general – SubjectFull: Nanoparticles Type: general – SubjectFull: Microstructure Type: general – SubjectFull: Magnetic properties Type: general Titles: – TitleFull: Revisiting reweighted robust standard deviation estimators for univariate Shewhart S‐charts. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Mutlu, Ece Çiğdem – PersonEntity: Name: NameFull: Alakent, Burak IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 06 Text: Jun2019 Type: published Y: 2019 Identifiers: – Type: issn-print Value: 07488017 Numbering: – Type: volume Value: 35 – Type: issue Value: 4 Titles: – TitleFull: Quality & Reliability Engineering International Type: main |
| ResultId | 1 |