Koddenberg, T., Wentzel, M., & Militz, H. (2019). Volumetric estimate of bordered pits in Pinus sylvestris based on X-ray tomography and light microscopy imaging. Micron, 124, 102704. https://doi.org/10.1016/j.micron.2019.102704
Chicago Style (17th ed.) CitationKoddenberg, Tim, Maximilian Wentzel, and Holger Militz. "Volumetric Estimate of Bordered Pits in Pinus Sylvestris Based on X-ray Tomography and Light Microscopy Imaging." Micron 124 (2019): 102704. https://doi.org/10.1016/j.micron.2019.102704.
MLA (9th ed.) CitationKoddenberg, Tim, et al. "Volumetric Estimate of Bordered Pits in Pinus Sylvestris Based on X-ray Tomography and Light Microscopy Imaging." Micron, vol. 124, 2019, p. 102704, https://doi.org/10.1016/j.micron.2019.102704.