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Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?

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Title: Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?
Authors: Östlin, C.1 (AUTHOR), Timneanu, N.1 (AUTHOR), Caleman, C.1 (AUTHOR) carl.caleman@physics.uu.se, Martin, A. V.2 (AUTHOR) andrew.martin@rmit.edu.au
Source: Structural Dynamics. 2019, Vol. 6 Issue 4, pN.PAG-N.PAG. 11p.
Subjects: X-ray lasers, Radiation damage, Free electron lasers, X-ray imaging, Coulomb explosion, Nanoparticles
Abstract: The prospect of single particle imaging with atomic resolution is one of the scientific drivers for the development of X-ray free-electron lasers. The assumption since the beginning has been that damage to the sample caused by intense X-ray pulses is one of the limiting factors for achieving subnanometer X-ray imaging of single particles and that X-ray pulses need to be as short as possible. Based on the molecular dynamics simulations of proteins in X-ray fields of various durations (5 fs, 25 fs, and 50 fs), we show that the noise in the diffracted signal caused by radiation damage is less than what can be expected from other sources, such as sample inhomogeneity and X-ray shot-to-shot variations. These findings show a different aspect of the feasibility of high-resolution single particle imaging using free-electron lasers, where employing X-ray pulses of longer durations could still provide a useful diffraction signal above the noise due to the Coulomb explosion. [ABSTRACT FROM AUTHOR]
Copyright of Structural Dynamics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
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PubTypeId: academicJournal
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  Data: <searchLink fieldCode="DE" term="%22X-ray+lasers%22">X-ray lasers</searchLink><br /><searchLink fieldCode="DE" term="%22Radiation+damage%22">Radiation damage</searchLink><br /><searchLink fieldCode="DE" term="%22Free+electron+lasers%22">Free electron lasers</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+imaging%22">X-ray imaging</searchLink><br /><searchLink fieldCode="DE" term="%22Coulomb+explosion%22">Coulomb explosion</searchLink><br /><searchLink fieldCode="DE" term="%22Nanoparticles%22">Nanoparticles</searchLink>
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  Label: Abstract
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  Data: The prospect of single particle imaging with atomic resolution is one of the scientific drivers for the development of X-ray free-electron lasers. The assumption since the beginning has been that damage to the sample caused by intense X-ray pulses is one of the limiting factors for achieving subnanometer X-ray imaging of single particles and that X-ray pulses need to be as short as possible. Based on the molecular dynamics simulations of proteins in X-ray fields of various durations (5 fs, 25 fs, and 50 fs), we show that the noise in the diffracted signal caused by radiation damage is less than what can be expected from other sources, such as sample inhomogeneity and X-ray shot-to-shot variations. These findings show a different aspect of the feasibility of high-resolution single particle imaging using free-electron lasers, where employing X-ray pulses of longer durations could still provide a useful diffraction signal above the noise due to the Coulomb explosion. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Structural Dynamics is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1063/1.5098309
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: N.PAG
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      – SubjectFull: X-ray lasers
        Type: general
      – SubjectFull: Radiation damage
        Type: general
      – SubjectFull: Free electron lasers
        Type: general
      – SubjectFull: X-ray imaging
        Type: general
      – SubjectFull: Coulomb explosion
        Type: general
      – SubjectFull: Nanoparticles
        Type: general
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      – TitleFull: Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?
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            NameFull: Östlin, C.
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            NameFull: Timneanu, N.
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            NameFull: Caleman, C.
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            NameFull: Martin, A. V.
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              M: 07
              Text: 2019
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            – TitleFull: Structural Dynamics
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