A New Sigma-Delta Modulator Architecture for Testing Using Digital Stimulus.
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| Title: | A New Sigma-Delta Modulator Architecture for Testing Using Digital Stimulus. |
|---|---|
| Authors: | Chee-Kian Ong1 ckong@ece.ucsb.edu, Kwang-Ting (Tim) Cheng, Li-C. Wang1 |
| Source: | IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Jan2004, Vol. 51 Issue 1, p206-213. 8p. |
| Subjects: | Analog-to-digital converters, Electronic modulators, Electronic noise, Digital electronics, Electronic modulation, Electrical engineering |
| Abstract: | Sigma-delta modulators are commonly used in high-resolution analog-to-digital converters (ADCs). Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. A new architecture for the modulator Is proposed so that its performance can be determined using only digital test stimulus. This architecture does not need analog test stimuli, which is prone to distortion/noise while setting up the high-resolution modulator for testing. Simulation results show that this technique Is capable of accurately determining the performance of a second-order sigma-delta modulator ADC. [ABSTRACT FROM AUTHOR] |
| Copyright of IEEE Transactions on Circuits & Systems. Part I: Regular Papers is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 13859273 AccessLevel: 6 PubType: Periodical PubTypeId: serialPeriodical PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: A New Sigma-Delta Modulator Architecture for Testing Using Digital Stimulus. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Chee-Kian+Ong%22">Chee-Kian Ong</searchLink><relatesTo>1</relatesTo><i> ckong@ece.ucsb.edu</i><br /><searchLink fieldCode="AR" term="%22Kwang-Ting+%28Tim%29+Cheng%22">Kwang-Ting (Tim) Cheng</searchLink><br /><searchLink fieldCode="AR" term="%22Li-C%2E+Wang%22">Li-C. Wang</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Circuits+%26+Systems%2E+Part+I%3A+Regular+Papers%22">IEEE Transactions on Circuits & Systems. Part I: Regular Papers</searchLink>. Jan2004, Vol. 51 Issue 1, p206-213. 8p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Analog-to-digital+converters%22">Analog-to-digital converters</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+modulators%22">Electronic modulators</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+noise%22">Electronic noise</searchLink><br /><searchLink fieldCode="DE" term="%22Digital+electronics%22">Digital electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Electronic+modulation%22">Electronic modulation</searchLink><br /><searchLink fieldCode="DE" term="%22Electrical+engineering%22">Electrical engineering</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Sigma-delta modulators are commonly used in high-resolution analog-to-digital converters (ADCs). Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. A new architecture for the modulator Is proposed so that its performance can be determined using only digital test stimulus. This architecture does not need analog test stimuli, which is prone to distortion/noise while setting up the high-resolution modulator for testing. Simulation results show that this technique Is capable of accurately determining the performance of a second-order sigma-delta modulator ADC. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of IEEE Transactions on Circuits & Systems. Part I: Regular Papers is the property of IEEE and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TCSI.2003.821305 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 206 Subjects: – SubjectFull: Analog-to-digital converters Type: general – SubjectFull: Electronic modulators Type: general – SubjectFull: Electronic noise Type: general – SubjectFull: Digital electronics Type: general – SubjectFull: Electronic modulation Type: general – SubjectFull: Electrical engineering Type: general Titles: – TitleFull: A New Sigma-Delta Modulator Architecture for Testing Using Digital Stimulus. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chee-Kian Ong – PersonEntity: Name: NameFull: Kwang-Ting (Tim) Cheng – PersonEntity: Name: NameFull: Li-C. Wang IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2004 Type: published Y: 2004 Identifiers: – Type: issn-print Value: 15498328 Numbering: – Type: volume Value: 51 – Type: issue Value: 1 Titles: – TitleFull: IEEE Transactions on Circuits & Systems. Part I: Regular Papers Type: main |
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