Bruno, L., & Gustafson, B. (2019). Head-on-Pillow Defect Detection: X-Ray Inspection Limitations. Journal of Microelectronic & Electronic Packaging, 16(2), 91. https://doi.org/10.4071/imaps.871613
Chicago Style (17th ed.) CitationBruno, Lars, and Benny Gustafson. "Head-on-Pillow Defect Detection: X-Ray Inspection Limitations." Journal of Microelectronic & Electronic Packaging 16, no. 2 (2019): 91. https://doi.org/10.4071/imaps.871613.
MLA (9th ed.) CitationBruno, Lars, and Benny Gustafson. "Head-on-Pillow Defect Detection: X-Ray Inspection Limitations." Journal of Microelectronic & Electronic Packaging, vol. 16, no. 2, 2019, p. 91, https://doi.org/10.4071/imaps.871613.
Warning: These citations may not always be 100% accurate.