XUV‐driven plasma switch for THz: new spatio‐temporal overlap tool for XUV–THz pump–probe experiments at FELs.
Saved in:
| Title: | XUV‐driven plasma switch for THz: new spatio‐temporal overlap tool for XUV–THz pump–probe experiments at FELs. |
|---|---|
| Authors: | Zapolnova, E.1 (AUTHOR), Pan, R.1 (AUTHOR), Golz, T.1 (AUTHOR), Sindik, M.1 (AUTHOR), Nikolic, M.1 (AUTHOR), Temme, M.1 (AUTHOR), Rabasovic, M.2 (AUTHOR), Grujic, D.2 (AUTHOR), Chen, Z.3 (AUTHOR), Toleikis, S.1 (AUTHOR), Stojanovic, N.1 (AUTHOR) nikola.stojanovic@desy.de |
| Source: | Journal of Synchrotron Radiation. Jan2020, Vol. 27 Issue 1, p11-16. 6p. |
| Subjects: | Free electron lasers, X-ray lasers, Optical properties |
| Abstract: | A simple and robust tool for spatio‐temporal overlap of THz and XUV pulses in in‐vacuum pump–probe experiments is presented. The technique exploits ultrafast changes of the optical properties in semiconductors (i.e. silicon) driven by ultrashort XUV pulses that are probed by THz pulses. This work demonstrates that this tool can be used for a large range of XUV fluences that are significantly lower than when probing by visible and near‐infrared pulses. This tool is mainly targeted at emerging X‐ray free‐electron laser facilities, but can be utilized also at table‐top high‐harmonics sources. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| Abstract: | A simple and robust tool for spatio‐temporal overlap of THz and XUV pulses in in‐vacuum pump–probe experiments is presented. The technique exploits ultrafast changes of the optical properties in semiconductors (i.e. silicon) driven by ultrashort XUV pulses that are probed by THz pulses. This work demonstrates that this tool can be used for a large range of XUV fluences that are significantly lower than when probing by visible and near‐infrared pulses. This tool is mainly targeted at emerging X‐ray free‐electron laser facilities, but can be utilized also at table‐top high‐harmonics sources. [ABSTRACT FROM AUTHOR] |
|---|---|
| ISSN: | 09090495 |
| DOI: | 10.1107/S1600577519014164 |
