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Characterisation of a silicon drift detector for high-resolution electron spectroscopy.

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Title: Characterisation of a silicon drift detector for high-resolution electron spectroscopy.
Authors: Gugiatti, Matteo1,2 (AUTHOR), Biassoni, Matteo3 (AUTHOR), Carminati, Marco1,2 (AUTHOR) marco1.carminati@polimi.it, Cremonesi, Oliviero3,4 (AUTHOR), Fiorini, Carlo1,2 (AUTHOR), King, Pietro1,2 (AUTHOR), Lechner, Peter5 (AUTHOR), Mertens, Susanne6,7 (AUTHOR), Pagnanini, Lorenzo3,4 (AUTHOR), Pavan, Maura3,4 (AUTHOR), Pozzi, Stefano3,4 (AUTHOR)
Source: Nuclear Instruments & Methods in Physics Research Section A. Nov2020, Vol. 979, pN.PAG-N.PAG. 1p.
Subjects: Silicon detectors, Electron spectroscopy, Beta decay, Scanning electron microscopes, Tritium, Sterile neutrinos
Abstract: Silicon Drift Detectors, widely employed in high-resolution and high-rate X-ray applications, are considered here with interest also for electron detection. The accurate measurement of the tritium beta decay is the core of the TRISTAN (TRitium Investigation on STerile to Active Neutrino mixing) project. This work presents the characterisation of a single-pixel SDD detector with a mono-energetic electron beam obtained from a Scanning Electron Microscope. The suitability of the SDD to detect electrons, in the energy range spanning from few keV to tens of keV, is demonstrated. Experimental measurements reveal a strong effect of the detector's entrance window structure on the observed energy response. A detailed detector model is therefore necessary to reconstruct the spectrum of an unknown beta-decay source. [ABSTRACT FROM AUTHOR]
Copyright of Nuclear Instruments & Methods in Physics Research Section A is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 145531825
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Characterisation of a silicon drift detector for high-resolution electron spectroscopy.
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  Data: <searchLink fieldCode="AR" term="%22Gugiatti%2C+Matteo%22">Gugiatti, Matteo</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Biassoni%2C+Matteo%22">Biassoni, Matteo</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Carminati%2C+Marco%22">Carminati, Marco</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> marco1.carminati@polimi.it</i><br /><searchLink fieldCode="AR" term="%22Cremonesi%2C+Oliviero%22">Cremonesi, Oliviero</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Fiorini%2C+Carlo%22">Fiorini, Carlo</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22King%2C+Pietro%22">King, Pietro</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Lechner%2C+Peter%22">Lechner, Peter</searchLink><relatesTo>5</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Mertens%2C+Susanne%22">Mertens, Susanne</searchLink><relatesTo>6,7</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pagnanini%2C+Lorenzo%22">Pagnanini, Lorenzo</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pavan%2C+Maura%22">Pavan, Maura</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pozzi%2C+Stefano%22">Pozzi, Stefano</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Nuclear+Instruments+%26+Methods+in+Physics+Research+Section+A%22">Nuclear Instruments & Methods in Physics Research Section A</searchLink>. Nov2020, Vol. 979, pN.PAG-N.PAG. 1p.
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  Data: <searchLink fieldCode="DE" term="%22Silicon+detectors%22">Silicon detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+spectroscopy%22">Electron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Beta+decay%22">Beta decay</searchLink><br /><searchLink fieldCode="DE" term="%22Scanning+electron+microscopes%22">Scanning electron microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Tritium%22">Tritium</searchLink><br /><searchLink fieldCode="DE" term="%22Sterile+neutrinos%22">Sterile neutrinos</searchLink>
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  Label: Abstract
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  Data: Silicon Drift Detectors, widely employed in high-resolution and high-rate X-ray applications, are considered here with interest also for electron detection. The accurate measurement of the tritium beta decay is the core of the TRISTAN (TRitium Investigation on STerile to Active Neutrino mixing) project. This work presents the characterisation of a single-pixel SDD detector with a mono-energetic electron beam obtained from a Scanning Electron Microscope. The suitability of the SDD to detect electrons, in the energy range spanning from few keV to tens of keV, is demonstrated. Experimental measurements reveal a strong effect of the detector's entrance window structure on the observed energy response. A detailed detector model is therefore necessary to reconstruct the spectrum of an unknown beta-decay source. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Nuclear Instruments & Methods in Physics Research Section A is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1016/j.nima.2020.164474
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      – Code: eng
        Text: English
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        PageCount: 1
        StartPage: N.PAG
    Subjects:
      – SubjectFull: Silicon detectors
        Type: general
      – SubjectFull: Electron spectroscopy
        Type: general
      – SubjectFull: Beta decay
        Type: general
      – SubjectFull: Scanning electron microscopes
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      – SubjectFull: Tritium
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      – SubjectFull: Sterile neutrinos
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      – TitleFull: Characterisation of a silicon drift detector for high-resolution electron spectroscopy.
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              Text: Nov2020
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