APA (7th ed.) Citation

Labardi, M. (2020). Model of frequency-modulated atomic force microscopy for interpretation of noncontact piezoresponse measurements. Nanotechnology, 31(24), 1. https://doi.org/10.1088/1361-6528/ab7b05

Chicago Style (17th ed.) Citation

Labardi, M. "Model of Frequency-modulated Atomic Force Microscopy for Interpretation of Noncontact Piezoresponse Measurements." Nanotechnology 31, no. 24 (2020): 1. https://doi.org/10.1088/1361-6528/ab7b05.

MLA (9th ed.) Citation

Labardi, M. "Model of Frequency-modulated Atomic Force Microscopy for Interpretation of Noncontact Piezoresponse Measurements." Nanotechnology, vol. 31, no. 24, 2020, p. 1, https://doi.org/10.1088/1361-6528/ab7b05.