Model of frequency-modulated atomic force microscopy for interpretation of noncontact piezoresponse measurements.
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| Title: | Model of frequency-modulated atomic force microscopy for interpretation of noncontact piezoresponse measurements. |
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| Authors: | Labardi, M (AUTHOR) labardi@df.unipi.it |
| Source: | Nanotechnology. 6/12/2020, Vol. 31 Issue 24, p1-8. 8p. |
| Subjects: | Piezoresponse force microscopy, Atomic models, Atomic force microscopes, Atomic force microscopy, Human behavior models, Nanotechnology |
| Abstract: | A model to describe the behavior of the probe of an atomic force microscope (AFM) operated in frequency modulation (FM) dynamic mode with constant excitation (CE) is developed, with the aim of describing recent experiments after the introduction of a noncontact piezoresponse force microscopy (PFM) method based on such an operation mode, named CE-FM-PFM (Labardi et al 2020 Nanotechnology 31 , 075707). The model provides insight into improving the accuracy of converse piezoelectric coefficient (d33) measurements on the local scale in this PFM mode. Its rather general applicability helps to quantify the residual electrostatic contribution in local piezoresponse measurements by AFM, which is anticipated to be strongly mitigated in the CE-FM-PFM compared to the more standard contact-mode PFM. [ABSTRACT FROM AUTHOR] |
| Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 145621662 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Model of frequency-modulated atomic force microscopy for interpretation of noncontact piezoresponse measurements. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Labardi%2C+M%22">Labardi, M</searchLink> (AUTHOR)<i> labardi@df.unipi.it</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Nanotechnology%22">Nanotechnology</searchLink>. 6/12/2020, Vol. 31 Issue 24, p1-8. 8p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Piezoresponse+force+microscopy%22">Piezoresponse force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+models%22">Atomic models</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopes%22">Atomic force microscopes</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Human+behavior+models%22">Human behavior models</searchLink><br /><searchLink fieldCode="DE" term="%22Nanotechnology%22">Nanotechnology</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: A model to describe the behavior of the probe of an atomic force microscope (AFM) operated in frequency modulation (FM) dynamic mode with constant excitation (CE) is developed, with the aim of describing recent experiments after the introduction of a noncontact piezoresponse force microscopy (PFM) method based on such an operation mode, named CE-FM-PFM (Labardi et al 2020 Nanotechnology 31 , 075707). The model provides insight into improving the accuracy of converse piezoelectric coefficient (d33) measurements on the local scale in this PFM mode. Its rather general applicability helps to quantify the residual electrostatic contribution in local piezoresponse measurements by AFM, which is anticipated to be strongly mitigated in the CE-FM-PFM compared to the more standard contact-mode PFM. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1088/1361-6528/ab7b05 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 8 StartPage: 1 Subjects: – SubjectFull: Piezoresponse force microscopy Type: general – SubjectFull: Atomic models Type: general – SubjectFull: Atomic force microscopes Type: general – SubjectFull: Atomic force microscopy Type: general – SubjectFull: Human behavior models Type: general – SubjectFull: Nanotechnology Type: general Titles: – TitleFull: Model of frequency-modulated atomic force microscopy for interpretation of noncontact piezoresponse measurements. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Labardi, M IsPartOfRelationships: – BibEntity: Dates: – D: 12 M: 06 Text: 6/12/2020 Type: published Y: 2020 Identifiers: – Type: issn-print Value: 09574484 Numbering: – Type: volume Value: 31 – Type: issue Value: 24 Titles: – TitleFull: Nanotechnology Type: main |
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