APA (7th ed.) Citation

Labardi, M., Bertolla, A., Sollogoub, C., Casalini, R., & Capaccioli, S. (2020). Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions. Nanotechnology, 31(33), 1. https://doi.org/10.1088/1361-6528/ab8ede

Chicago Style (17th ed.) Citation

Labardi, M., A. Bertolla, C. Sollogoub, R. Casalini, and S. Capaccioli. "Lateral Resolution of Electrostatic Force Microscopy for Mapping of Dielectric Interfaces in Ambient Conditions." Nanotechnology 31, no. 33 (2020): 1. https://doi.org/10.1088/1361-6528/ab8ede.

MLA (9th ed.) Citation

Labardi, M., et al. "Lateral Resolution of Electrostatic Force Microscopy for Mapping of Dielectric Interfaces in Ambient Conditions." Nanotechnology, vol. 31, no. 33, 2020, p. 1, https://doi.org/10.1088/1361-6528/ab8ede.