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Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.

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Title: Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.
Authors: Labardi, M (AUTHOR) labardi@df.unipi.it, Bertolla, A (AUTHOR), Sollogoub, C (AUTHOR), Casalini, R (AUTHOR), Capaccioli, S (AUTHOR)
Source: Nanotechnology. 8/14/2020, Vol. 31 Issue 33, p1-9. 9p.
Subjects: Dielectric materials, Dielectrics, Electric lines, Microscopy, Cahn-Hilliard-Cook equation, Data reduction
Abstract: The attainable lateral resolution of electrostatic force microscopy (EFM) in an ambient air environment on dielectric materials was characterized on a reference sample comprised of two distinct, immiscible glassy polymers cut in a cross-section by ultramicrotomy. Such a sample can be modeled as two semi-infinite dielectrics with a sharp interface, presenting a quasi-ideal, sharp dielectric contrast. Electric polarizability line profiles across the interface were obtained, in both lift-mode and feedback-regulated dynamic mode EFM, as a function of probe/surface separation, for different cases of oscillation amplitudes. We find that the results do not match predictions for dielectric samples, but comply well or are even better than predicted for conductive interfaces. A resolution down to 3 nm can be obtained by operating in feedback-regulated EFM realized by adopting constant-excitation frequency-modulation mode. This suggests resolution is ruled by the closest approach distance rather than by average separation, even with probe oscillation amplitudes as high as 10 nm. For better comparison with theoretical predictions, effective probe radii and cone aperture angles were derived from approach curves, by also taking into account the finite oscillation amplitude of the probe, by exploiting a data reduction procedure previously devised for the derivation of interatomic potentials. [ABSTRACT FROM AUTHOR]
Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
An: 145621757
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  Data: Lateral resolution of electrostatic force microscopy for mapping of dielectric interfaces in ambient conditions.
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  Data: <searchLink fieldCode="AR" term="%22Labardi%2C+M%22">Labardi, M</searchLink> (AUTHOR)<i> labardi@df.unipi.it</i><br /><searchLink fieldCode="AR" term="%22Bertolla%2C+A%22">Bertolla, A</searchLink> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sollogoub%2C+C%22">Sollogoub, C</searchLink> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Casalini%2C+R%22">Casalini, R</searchLink> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Capaccioli%2C+S%22">Capaccioli, S</searchLink> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Nanotechnology%22">Nanotechnology</searchLink>. 8/14/2020, Vol. 31 Issue 33, p1-9. 9p.
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  Data: <searchLink fieldCode="DE" term="%22Dielectric+materials%22">Dielectric materials</searchLink><br /><searchLink fieldCode="DE" term="%22Dielectrics%22">Dielectrics</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+lines%22">Electric lines</searchLink><br /><searchLink fieldCode="DE" term="%22Microscopy%22">Microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Cahn-Hilliard-Cook+equation%22">Cahn-Hilliard-Cook equation</searchLink><br /><searchLink fieldCode="DE" term="%22Data+reduction%22">Data reduction</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The attainable lateral resolution of electrostatic force microscopy (EFM) in an ambient air environment on dielectric materials was characterized on a reference sample comprised of two distinct, immiscible glassy polymers cut in a cross-section by ultramicrotomy. Such a sample can be modeled as two semi-infinite dielectrics with a sharp interface, presenting a quasi-ideal, sharp dielectric contrast. Electric polarizability line profiles across the interface were obtained, in both lift-mode and feedback-regulated dynamic mode EFM, as a function of probe/surface separation, for different cases of oscillation amplitudes. We find that the results do not match predictions for dielectric samples, but comply well or are even better than predicted for conductive interfaces. A resolution down to 3 nm can be obtained by operating in feedback-regulated EFM realized by adopting constant-excitation frequency-modulation mode. This suggests resolution is ruled by the closest approach distance rather than by average separation, even with probe oscillation amplitudes as high as 10 nm. For better comparison with theoretical predictions, effective probe radii and cone aperture angles were derived from approach curves, by also taking into account the finite oscillation amplitude of the probe, by exploiting a data reduction procedure previously devised for the derivation of interatomic potentials. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1088/1361-6528/ab8ede
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      – Code: eng
        Text: English
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        Type: general
      – SubjectFull: Dielectrics
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      – SubjectFull: Electric lines
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      – SubjectFull: Cahn-Hilliard-Cook equation
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      – SubjectFull: Data reduction
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              Text: 8/14/2020
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