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Error ratio model for synchronised‐OOK IR‐UWB receivers in AWGN channels.

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Title: Error ratio model for synchronised‐OOK IR‐UWB receivers in AWGN channels.
Authors: Crepaldi, M.1 (AUTHOR) marco.crepaldi@iit.it, Kinget, P.R.2 (AUTHOR)
Source: Electronics Letters (Wiley-Blackwell). Jan2013, Vol. 49 Issue 1, p25-27. 3p.
Abstract: Synchronised On/Off keying (S‐OOK) is a pulse modulation format where timing synchronisation pulses are embedded with each bit in the data stream resulting in a 1.5 pulse/bit format, but allowing for synchronisation and demodulation with a single block. In this reported work, the error ratio for S‐OOK symbols received in a non‐fading AWGN channel is analysed and a mathematical model aware of the physical parameters of a CMOS integrated prototype is introduced. Using this model, the S‐OOK RX sensitivity is shown to be close to that of a high‐threshold OOK RX for similar error‐ratios but assuming perfect synchronisation. [ABSTRACT FROM AUTHOR]
Copyright of Electronics Letters (Wiley-Blackwell) is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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Items – Name: Title
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  Data: Error ratio model for synchronised‐OOK IR‐UWB receivers in AWGN channels.
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  Data: <searchLink fieldCode="AR" term="%22Crepaldi%2C+M%2E%22">Crepaldi, M.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> marco.crepaldi@iit.it</i><br /><searchLink fieldCode="AR" term="%22Kinget%2C+P%2ER%2E%22">Kinget, P.R.</searchLink><relatesTo>2</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Electronics+Letters+%28Wiley-Blackwell%29%22">Electronics Letters (Wiley-Blackwell)</searchLink>. Jan2013, Vol. 49 Issue 1, p25-27. 3p.
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Synchronised On/Off keying (S‐OOK) is a pulse modulation format where timing synchronisation pulses are embedded with each bit in the data stream resulting in a 1.5 pulse/bit format, but allowing for synchronisation and demodulation with a single block. In this reported work, the error ratio for S‐OOK symbols received in a non‐fading AWGN channel is analysed and a mathematical model aware of the physical parameters of a CMOS integrated prototype is introduced. Using this model, the S‐OOK RX sensitivity is shown to be close to that of a high‐threshold OOK RX for similar error‐ratios but assuming perfect synchronisation. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Electronics Letters (Wiley-Blackwell) is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1049/el.2012.3607
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      – Code: eng
        Text: English
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        PageCount: 3
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      – TitleFull: Error ratio model for synchronised‐OOK IR‐UWB receivers in AWGN channels.
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              Text: Jan2013
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              Y: 2013
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