CONSEQUENCE OF SOURCE RIPPLE FACTOR IN CONDUCTED VOLTAGE EMISSION MEASUREMENT.
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| Title: | CONSEQUENCE OF SOURCE RIPPLE FACTOR IN CONDUCTED VOLTAGE EMISSION MEASUREMENT. |
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| Authors: | Shah, Smit1 smit.454.shah@gmail.com, Sidapara, Akhilesh1, Parikh, Kalpesh1, Gajera, Puran1, Gupta, Vinod1 |
| Source: | Reliability: Theory & Applications. 2021 Supplement, Vol. 60, p325-334. 10p. |
| Subjects: | Electromagnetic interference, Ripple (Computer network protocol) |
| Abstract: | Huge dv/dt and di/dt due to high switching frequency and ripples present in AC-DC converter infallibly introduce unwanted Electromagnetic Interference (EMI) noise voltage through parasitic/distributed parameters of the DC source. In this paper, the entire test setup for conducted emission (CE) is made to measure the conducted voltage disturbance of Equipment Under Test (EUT) due to various DC sources with different percentage ripple factors used to supply. The measurement carried out in the frequency band 150kHz to 30MHz as per CISPR 11 [2]/CISPR 22 [1]. The dominated DC source responsible for the significant conducted voltage disturbance measurement results are analyzed and to mitigate the conducted emission manoeuvring based on DC source is proposed. Practical measurement are used to validate the mitigation method. [ABSTRACT FROM AUTHOR] |
| Copyright of Reliability: Theory & Applications is the property of International Group on Reliability and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 149259899 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: CONSEQUENCE OF SOURCE RIPPLE FACTOR IN CONDUCTED VOLTAGE EMISSION MEASUREMENT. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Shah%2C+Smit%22">Shah, Smit</searchLink><relatesTo>1</relatesTo><i> smit.454.shah@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Sidapara%2C+Akhilesh%22">Sidapara, Akhilesh</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Parikh%2C+Kalpesh%22">Parikh, Kalpesh</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Gajera%2C+Puran%22">Gajera, Puran</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AR" term="%22Gupta%2C+Vinod%22">Gupta, Vinod</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Reliability%3A+Theory+%26+Applications%22">Reliability: Theory & Applications</searchLink>. 2021 Supplement, Vol. 60, p325-334. 10p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Electromagnetic+interference%22">Electromagnetic interference</searchLink><br /><searchLink fieldCode="DE" term="%22Ripple+%28Computer+network+protocol%29%22">Ripple (Computer network protocol)</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Huge dv/dt and di/dt due to high switching frequency and ripples present in AC-DC converter infallibly introduce unwanted Electromagnetic Interference (EMI) noise voltage through parasitic/distributed parameters of the DC source. In this paper, the entire test setup for conducted emission (CE) is made to measure the conducted voltage disturbance of Equipment Under Test (EUT) due to various DC sources with different percentage ripple factors used to supply. The measurement carried out in the frequency band 150kHz to 30MHz as per CISPR 11 [2]/CISPR 22 [1]. The dominated DC source responsible for the significant conducted voltage disturbance measurement results are analyzed and to mitigate the conducted emission manoeuvring based on DC source is proposed. Practical measurement are used to validate the mitigation method. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Reliability: Theory & Applications is the property of International Group on Reliability and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 325 Subjects: – SubjectFull: Electromagnetic interference Type: general – SubjectFull: Ripple (Computer network protocol) Type: general Titles: – TitleFull: CONSEQUENCE OF SOURCE RIPPLE FACTOR IN CONDUCTED VOLTAGE EMISSION MEASUREMENT. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Shah, Smit – PersonEntity: Name: NameFull: Sidapara, Akhilesh – PersonEntity: Name: NameFull: Parikh, Kalpesh – PersonEntity: Name: NameFull: Gajera, Puran – PersonEntity: Name: NameFull: Gupta, Vinod IsPartOfRelationships: – BibEntity: Dates: – D: 02 M: 01 Text: 2021 Supplement Type: published Y: 2021 Identifiers: – Type: issn-print Value: 19322321 Numbering: – Type: volume Value: 60 Titles: – TitleFull: Reliability: Theory & Applications Type: main |
| ResultId | 1 |
