Sensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO3 based solid solutions.
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| Title: | Sensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO |
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| Authors: | Razaghi Pey Ghaleh, Masoumeh1 (AUTHOR), d'Esperonnat, Marc1 (AUTHOR), Botella, Claude1 (AUTHOR), Cueff, Sébastien1 (AUTHOR), Bachelet, Romain1 (AUTHOR), Saint-Girons, Guillaume1 (AUTHOR) guillaume.saint-girons@ec-lyon.fr |
| Source: | CrystEngComm. 3/21/2021, Vol. 23 Issue 11, p2269-2275. 7p. |
| Subjects: | Reflection high energy electron diffraction, Molecular beam epitaxy, Solid solutions, Surface reconstruction |
| Abstract: | Molecular beam epitaxy (MBE) is the best suited technique to engineer perovskite oxide properties, thanks to individual atom evaporation from elemental sources. Unfortunately, significant source drift often prevents exploiting this advantage, and improving the control of the composition of MBE grown oxide thin layers remains a challenge. In this context, in situ reflection high energy electron diffraction (RHEED) has long been identified as a useful tool, as surface reconstructions and RHEED oscillations depend on oxide cationic composition. We show here that monitoring the appearance of half-order streaks along the [210] RHEED azimuths of Ti-rich surfaces provides enhanced control of the cationic composition of SrTiO3 thin layers as compared to the more common strategy relying on [100] azimuths monitoring. We also provide quantitative evaluation of the uncertainty on composition control enabled by this method, namely ±6.7%. In the end, we describe an original procedure to control the composition of perovskite oxide quaternary solid solutions. [ABSTRACT FROM AUTHOR] |
| Copyright of CrystEngComm is the property of Royal Society of Chemistry and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 149410898 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Sensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO<subscript>3</subscript> based solid solutions. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Razaghi+Pey+Ghaleh%2C+Masoumeh%22">Razaghi Pey Ghaleh, Masoumeh</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22d'Esperonnat%2C+Marc%22">d'Esperonnat, Marc</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Botella%2C+Claude%22">Botella, Claude</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Cueff%2C+Sébastien%22">Cueff, Sébastien</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bachelet%2C+Romain%22">Bachelet, Romain</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Saint-Girons%2C+Guillaume%22">Saint-Girons, Guillaume</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> guillaume.saint-girons@ec-lyon.fr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22CrystEngComm%22">CrystEngComm</searchLink>. 3/21/2021, Vol. 23 Issue 11, p2269-2275. 7p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Reflection+high+energy+electron+diffraction%22">Reflection high energy electron diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Molecular+beam+epitaxy%22">Molecular beam epitaxy</searchLink><br /><searchLink fieldCode="DE" term="%22Solid+solutions%22">Solid solutions</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+reconstruction%22">Surface reconstruction</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Molecular beam epitaxy (MBE) is the best suited technique to engineer perovskite oxide properties, thanks to individual atom evaporation from elemental sources. Unfortunately, significant source drift often prevents exploiting this advantage, and improving the control of the composition of MBE grown oxide thin layers remains a challenge. In this context, in situ reflection high energy electron diffraction (RHEED) has long been identified as a useful tool, as surface reconstructions and RHEED oscillations depend on oxide cationic composition. We show here that monitoring the appearance of half-order streaks along the [210] RHEED azimuths of Ti-rich surfaces provides enhanced control of the cationic composition of SrTiO3 thin layers as compared to the more common strategy relying on [100] azimuths monitoring. We also provide quantitative evaluation of the uncertainty on composition control enabled by this method, namely ±6.7%. In the end, we describe an original procedure to control the composition of perovskite oxide quaternary solid solutions. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of CrystEngComm is the property of Royal Society of Chemistry and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1039/d1ce00013f Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 7 StartPage: 2269 Subjects: – SubjectFull: Reflection high energy electron diffraction Type: general – SubjectFull: Molecular beam epitaxy Type: general – SubjectFull: Solid solutions Type: general – SubjectFull: Surface reconstruction Type: general Titles: – TitleFull: Sensitive RHEED signature of Ti-excess enabling enhanced cationic composition control during the molecular beam epitaxy of SrTiO3 based solid solutions. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Razaghi Pey Ghaleh, Masoumeh – PersonEntity: Name: NameFull: d'Esperonnat, Marc – PersonEntity: Name: NameFull: Botella, Claude – PersonEntity: Name: NameFull: Cueff, Sébastien – PersonEntity: Name: NameFull: Bachelet, Romain – PersonEntity: Name: NameFull: Saint-Girons, Guillaume IsPartOfRelationships: – BibEntity: Dates: – D: 21 M: 03 Text: 3/21/2021 Type: published Y: 2021 Identifiers: – Type: issn-print Value: 14668033 Numbering: – Type: volume Value: 23 – Type: issue Value: 11 Titles: – TitleFull: CrystEngComm Type: main |
| ResultId | 1 |
