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Refinements in phase fraction determination of textured alloys from transmission diffraction data.

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Title: Refinements in phase fraction determination of textured alloys from transmission diffraction data.
Authors: Creuziger, Adam1 (AUTHOR) adam.creuziger@nist.gov, Phan, Thien2 (AUTHOR), Pagan, Darren3,4 (AUTHOR)
Source: Journal of Applied Crystallography. Oct2021, Vol. 54 Issue 5, p1480-1489. 10p.
Subjects: Data transmission systems, Alloys, X-ray diffraction, Synchrotron radiation, Magnitude (Mathematics), Fractions
Abstract: The use of high‐energy synchrotron X‐ray diffraction sources has become increasingly common for high‐quality phase fraction measurements and microstructural evolution experiments. While the high flux, large volume illuminated and large number of diffraction vectors should reduce common sources of uncertainty and bias, the distribution of the diffraction vectors may still cause bias in the phase fraction measurement. This hypothesis of bias was investigated with example experimental data and synthetic data. The authors found that there may be bias depending on the sample texture, the distribution of diffraction vectors and the hkl planes used in the phase fraction measurement, even for nearly complete coverage of a pole figure. The authors developed a series of geometry‐based correction values that reduced the measurement bias due to sampling scheme and texture in the phase fraction measurement by an order of magnitude. The efficacy of these corrections was demonstrated with application to both experimental and synthetic data. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
An: 152818748
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PubTypeId: academicJournal
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  Data: Refinements in phase fraction determination of textured alloys from transmission diffraction data.
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  Data: <searchLink fieldCode="AR" term="%22Creuziger%2C+Adam%22">Creuziger, Adam</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> adam.creuziger@nist.gov</i><br /><searchLink fieldCode="AR" term="%22Phan%2C+Thien%22">Phan, Thien</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Pagan%2C+Darren%22">Pagan, Darren</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Crystallography%22">Journal of Applied Crystallography</searchLink>. Oct2021, Vol. 54 Issue 5, p1480-1489. 10p.
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  Data: <searchLink fieldCode="DE" term="%22Data+transmission+systems%22">Data transmission systems</searchLink><br /><searchLink fieldCode="DE" term="%22Alloys%22">Alloys</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Synchrotron+radiation%22">Synchrotron radiation</searchLink><br /><searchLink fieldCode="DE" term="%22Magnitude+%28Mathematics%29%22">Magnitude (Mathematics)</searchLink><br /><searchLink fieldCode="DE" term="%22Fractions%22">Fractions</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The use of high‐energy synchrotron X‐ray diffraction sources has become increasingly common for high‐quality phase fraction measurements and microstructural evolution experiments. While the high flux, large volume illuminated and large number of diffraction vectors should reduce common sources of uncertainty and bias, the distribution of the diffraction vectors may still cause bias in the phase fraction measurement. This hypothesis of bias was investigated with example experimental data and synthetic data. The authors found that there may be bias depending on the sample texture, the distribution of diffraction vectors and the hkl planes used in the phase fraction measurement, even for nearly complete coverage of a pole figure. The authors developed a series of geometry‐based correction values that reduced the measurement bias due to sampling scheme and texture in the phase fraction measurement by an order of magnitude. The efficacy of these corrections was demonstrated with application to both experimental and synthetic data. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Applied Crystallography is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1107/S1600576721008712
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      – Code: eng
        Text: English
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    Subjects:
      – SubjectFull: Data transmission systems
        Type: general
      – SubjectFull: Alloys
        Type: general
      – SubjectFull: X-ray diffraction
        Type: general
      – SubjectFull: Synchrotron radiation
        Type: general
      – SubjectFull: Magnitude (Mathematics)
        Type: general
      – SubjectFull: Fractions
        Type: general
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      – TitleFull: Refinements in phase fraction determination of textured alloys from transmission diffraction data.
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            NameFull: Creuziger, Adam
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            NameFull: Phan, Thien
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            NameFull: Pagan, Darren
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            – D: 01
              M: 10
              Text: Oct2021
              Type: published
              Y: 2021
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