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Two-Stage Short-Run ([Xbar], s) Control Charts.

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Title: Two-Stage Short-Run ([Xbar], s) Control Charts.
Authors: Elam, Matthew E.1 (AUTHOR) melam@bama.ua.edu, Case, Kenneth E.2 (AUTHOR)
Source: Quality Engineering. 2005, Vol. 17 Issue 1, p95-107. 13p. 1 Chart.
Subjects: Quality control charts, Statistical process control, Standard deviations, Process control systems, Quality control, Analysis of variance
Abstract: This article develops the theory that is needed to apply the two-stage short-run theory of control charting to ([Xbar], s) charts. It then uses this theory to derive the equations for calculating the factors required to determine two-stage short-run control limits for ([Xbar], s) charts. Also, equations to calculate conventional control chart constants for ([Xbar], s) charts are derived. Additionally, this article gives advantages of two-stage short-run ([Xbar], s) control charts. [ABSTRACT FROM AUTHOR]
Copyright of Quality Engineering is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 15332249
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Two-Stage Short-Run ([Xbar], s) Control Charts.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Elam%2C+Matthew+E%2E%22">Elam, Matthew E.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> melam@bama.ua.edu</i><br /><searchLink fieldCode="AR" term="%22Case%2C+Kenneth+E%2E%22">Case, Kenneth E.</searchLink><relatesTo>2</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Quality+Engineering%22">Quality Engineering</searchLink>. 2005, Vol. 17 Issue 1, p95-107. 13p. 1 Chart.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Quality+control+charts%22">Quality control charts</searchLink><br /><searchLink fieldCode="DE" term="%22Statistical+process+control%22">Statistical process control</searchLink><br /><searchLink fieldCode="DE" term="%22Standard+deviations%22">Standard deviations</searchLink><br /><searchLink fieldCode="DE" term="%22Process+control+systems%22">Process control systems</searchLink><br /><searchLink fieldCode="DE" term="%22Quality+control%22">Quality control</searchLink><br /><searchLink fieldCode="DE" term="%22Analysis+of+variance%22">Analysis of variance</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: This article develops the theory that is needed to apply the two-stage short-run theory of control charting to ([Xbar], s) charts. It then uses this theory to derive the equations for calculating the factors required to determine two-stage short-run control limits for ([Xbar], s) charts. Also, equations to calculate conventional control chart constants for ([Xbar], s) charts are derived. Additionally, this article gives advantages of two-stage short-run ([Xbar], s) control charts. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Quality Engineering is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1081/QEN-200028714
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 13
        StartPage: 95
    Subjects:
      – SubjectFull: Quality control charts
        Type: general
      – SubjectFull: Statistical process control
        Type: general
      – SubjectFull: Standard deviations
        Type: general
      – SubjectFull: Process control systems
        Type: general
      – SubjectFull: Quality control
        Type: general
      – SubjectFull: Analysis of variance
        Type: general
    Titles:
      – TitleFull: Two-Stage Short-Run ([Xbar], s) Control Charts.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Elam, Matthew E.
      – PersonEntity:
          Name:
            NameFull: Case, Kenneth E.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 03
              Text: 2005
              Type: published
              Y: 2005
          Identifiers:
            – Type: issn-print
              Value: 08982112
          Numbering:
            – Type: volume
              Value: 17
            – Type: issue
              Value: 1
          Titles:
            – TitleFull: Quality Engineering
              Type: main
ResultId 1