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Tuning-fork-based piezoresponse force microscopy.

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Title: Tuning-fork-based piezoresponse force microscopy.
Authors: Labardi, M1,2 (AUTHOR) labardi@df.unipi.it, Capaccioli, S1,3,4 (AUTHOR)
Source: Nanotechnology. 10/29/2021, Vol. 32 Issue 44, p1-13. 13p.
Subjects: Piezoresponse force microscopy, Lithium niobate, Piezoelectric materials, Triglycine sulfate, Ferroelectric crystals, Electric potential, Quartz, Ferroelectric polymers
Abstract: Surface displacements of a few picometers, occurring after application of an electric potential to piezoelectric materials, can be detected and mapped with nanometer-scale lateral resolution by scanning probe methods, the most notable being piezoresponse force microscopy (PFM). Yet, absolute determination of such displacements, giving access for instance to materials' piezoelectric coefficients, are hindered by both mechanical and electrostatic side-effects, requiring complex experimental and/or post-processing procedures for carrying out reliable results. The employment of quartz tuning-fork force sensors in an intermittent contact mode PFM is able to provide measurements of electrically-induced surface displacements that are not influenced by electrostatic side-effects typical of more conventional cantilever-based PFM. The method is shown to yield piezoeffect mapping on standard ferroelectric test crystals (periodically-poled lithium niobate and triglycine sulfate), as well as on a ferroelectric polymer (PVDF), with no visible influence from the applied dc electric potential. [ABSTRACT FROM AUTHOR]
Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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Header DbId: egs
DbLabel: Engineering Source
An: 153474716
AccessLevel: 6
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PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Tuning-fork-based piezoresponse force microscopy.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AR" term="%22Labardi%2C+M%22">Labardi, M</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> labardi@df.unipi.it</i><br /><searchLink fieldCode="AR" term="%22Capaccioli%2C+S%22">Capaccioli, S</searchLink><relatesTo>1,3,4</relatesTo> (AUTHOR)
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Nanotechnology%22">Nanotechnology</searchLink>. 10/29/2021, Vol. 32 Issue 44, p1-13. 13p.
– Name: Subject
  Label: Subjects
  Group: Su
  Data: <searchLink fieldCode="DE" term="%22Piezoresponse+force+microscopy%22">Piezoresponse force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Lithium+niobate%22">Lithium niobate</searchLink><br /><searchLink fieldCode="DE" term="%22Piezoelectric+materials%22">Piezoelectric materials</searchLink><br /><searchLink fieldCode="DE" term="%22Triglycine+sulfate%22">Triglycine sulfate</searchLink><br /><searchLink fieldCode="DE" term="%22Ferroelectric+crystals%22">Ferroelectric crystals</searchLink><br /><searchLink fieldCode="DE" term="%22Electric+potential%22">Electric potential</searchLink><br /><searchLink fieldCode="DE" term="%22Quartz%22">Quartz</searchLink><br /><searchLink fieldCode="DE" term="%22Ferroelectric+polymers%22">Ferroelectric polymers</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Surface displacements of a few picometers, occurring after application of an electric potential to piezoelectric materials, can be detected and mapped with nanometer-scale lateral resolution by scanning probe methods, the most notable being piezoresponse force microscopy (PFM). Yet, absolute determination of such displacements, giving access for instance to materials' piezoelectric coefficients, are hindered by both mechanical and electrostatic side-effects, requiring complex experimental and/or post-processing procedures for carrying out reliable results. The employment of quartz tuning-fork force sensors in an intermittent contact mode PFM is able to provide measurements of electrically-induced surface displacements that are not influenced by electrostatic side-effects typical of more conventional cantilever-based PFM. The method is shown to yield piezoeffect mapping on standard ferroelectric test crystals (periodically-poled lithium niobate and triglycine sulfate), as well as on a ferroelectric polymer (PVDF), with no visible influence from the applied dc electric potential. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1088/1361-6528/ac1634
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 13
        StartPage: 1
    Subjects:
      – SubjectFull: Piezoresponse force microscopy
        Type: general
      – SubjectFull: Lithium niobate
        Type: general
      – SubjectFull: Piezoelectric materials
        Type: general
      – SubjectFull: Triglycine sulfate
        Type: general
      – SubjectFull: Ferroelectric crystals
        Type: general
      – SubjectFull: Electric potential
        Type: general
      – SubjectFull: Quartz
        Type: general
      – SubjectFull: Ferroelectric polymers
        Type: general
    Titles:
      – TitleFull: Tuning-fork-based piezoresponse force microscopy.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Labardi, M
      – PersonEntity:
          Name:
            NameFull: Capaccioli, S
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 29
              M: 10
              Text: 10/29/2021
              Type: published
              Y: 2021
          Identifiers:
            – Type: issn-print
              Value: 09574484
          Numbering:
            – Type: volume
              Value: 32
            – Type: issue
              Value: 44
          Titles:
            – TitleFull: Nanotechnology
              Type: main
ResultId 1