APA (7th ed.) Citation

Pavan, C. L. N., Divakaruni, R., Chakravorty, A., & Nair, D. R. (2022). Characterization and Analysis of Random Telegraph Noise in Scaled SiGe Channel HKMG pMOSFETs. IEEE Transactions on Electron Devices, 69(2), 456. https://doi.org/10.1109/TED.2021.3133203

Chicago Style (17th ed.) Citation

Pavan, Ch. L. N., Rama Divakaruni, Anjan Chakravorty, and Deleep R. Nair. "Characterization and Analysis of Random Telegraph Noise in Scaled SiGe Channel HKMG PMOSFETs." IEEE Transactions on Electron Devices 69, no. 2 (2022): 456. https://doi.org/10.1109/TED.2021.3133203.

MLA (9th ed.) Citation

Pavan, Ch. L. N., et al. "Characterization and Analysis of Random Telegraph Noise in Scaled SiGe Channel HKMG PMOSFETs." IEEE Transactions on Electron Devices, vol. 69, no. 2, 2022, p. 456, https://doi.org/10.1109/TED.2021.3133203.