Intermittent-contact local dielectric spectroscopy of nanostructured interfaces.
Saved in:
| Title: | Intermittent-contact local dielectric spectroscopy of nanostructured interfaces. |
|---|---|
| Authors: | Labardi, M1 (AUTHOR) labardi@df.unipi.it, Tripathi, P1 (AUTHOR), Capaccioli, S1,2,3 (AUTHOR), Casalini, R4 (AUTHOR) |
| Source: | Nanotechnology. 5/21/2022, Vol. 33 Issue 21, p1-12. 12p. |
| Subjects: | Diblock copolymers, Dielectrics, Spectral imaging, Dielectric properties, Glass construction, Spectrometry, Atomic force microscopy |
| Abstract: | Local dielectric spectroscopy (LDS) is a scanning probe method, based on dynamic-mode atomic force microscopy (AFM), to discriminate dielectric properties at surfaces with nanometer-scale lateral resolution. Until now a sub-10 nm resolution for LDS has not been documented, that would give access to the length scale of fundamental physical phenomena such as the cooperativity length related to structural arrest in glass formers (2â€"3 nm). In this work, LDS performed by a peculiar variant of intermittent-contact mode of AFM, named constant-excitation frequency modulation, was introduced and extensively explored in order to assess its best resolution capability. Dependence of resolution and contrast of dielectric imaging and spectroscopy on operation parameters like probe oscillation amplitude and free amplitude, the resulting frequency shift, and probe/surface distance-regulation feedback gain, were explored. By using thin films of a diblock copolymer of polystyrene (PS) and polymethylmethacrylate (PMMA), exhibiting phase separation on the nanometer scale, lateral resolution of at least 3 nm was demonstrated in both dielectric imaging and localized spectroscopy, by operating with optimized parameters. The interface within lamellar PS/PMMA was mapped, with a best width in the range between 1 and 3 nm. Changes of characteristic time of the secondary (β) relaxation process of PMMA could be tracked across the interface with PS. [ABSTRACT FROM AUTHOR] |
| Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Text: Availability: 0 |
|---|---|
| Header | DbId: egs DbLabel: Engineering Source An: 155604234 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Intermittent-contact local dielectric spectroscopy of nanostructured interfaces. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Labardi%2C+M%22">Labardi, M</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> labardi@df.unipi.it</i><br /><searchLink fieldCode="AR" term="%22Tripathi%2C+P%22">Tripathi, P</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Capaccioli%2C+S%22">Capaccioli, S</searchLink><relatesTo>1,2,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Casalini%2C+R%22">Casalini, R</searchLink><relatesTo>4</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Nanotechnology%22">Nanotechnology</searchLink>. 5/21/2022, Vol. 33 Issue 21, p1-12. 12p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Diblock+copolymers%22">Diblock copolymers</searchLink><br /><searchLink fieldCode="DE" term="%22Dielectrics%22">Dielectrics</searchLink><br /><searchLink fieldCode="DE" term="%22Spectral+imaging%22">Spectral imaging</searchLink><br /><searchLink fieldCode="DE" term="%22Dielectric+properties%22">Dielectric properties</searchLink><br /><searchLink fieldCode="DE" term="%22Glass+construction%22">Glass construction</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrometry%22">Spectrometry</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Local dielectric spectroscopy (LDS) is a scanning probe method, based on dynamic-mode atomic force microscopy (AFM), to discriminate dielectric properties at surfaces with nanometer-scale lateral resolution. Until now a sub-10 nm resolution for LDS has not been documented, that would give access to the length scale of fundamental physical phenomena such as the cooperativity length related to structural arrest in glass formers (2â€"3 nm). In this work, LDS performed by a peculiar variant of intermittent-contact mode of AFM, named constant-excitation frequency modulation, was introduced and extensively explored in order to assess its best resolution capability. Dependence of resolution and contrast of dielectric imaging and spectroscopy on operation parameters like probe oscillation amplitude and free amplitude, the resulting frequency shift, and probe/surface distance-regulation feedback gain, were explored. By using thin films of a diblock copolymer of polystyrene (PS) and polymethylmethacrylate (PMMA), exhibiting phase separation on the nanometer scale, lateral resolution of at least 3 nm was demonstrated in both dielectric imaging and localized spectroscopy, by operating with optimized parameters. The interface within lamellar PS/PMMA was mapped, with a best width in the range between 1 and 3 nm. Changes of characteristic time of the secondary (β) relaxation process of PMMA could be tracked across the interface with PS. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Nanotechnology is the property of IOP Publishing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=155604234 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1088/1361-6528/ac52be Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 1 Subjects: – SubjectFull: Diblock copolymers Type: general – SubjectFull: Dielectrics Type: general – SubjectFull: Spectral imaging Type: general – SubjectFull: Dielectric properties Type: general – SubjectFull: Glass construction Type: general – SubjectFull: Spectrometry Type: general – SubjectFull: Atomic force microscopy Type: general Titles: – TitleFull: Intermittent-contact local dielectric spectroscopy of nanostructured interfaces. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Labardi, M – PersonEntity: Name: NameFull: Tripathi, P – PersonEntity: Name: NameFull: Capaccioli, S – PersonEntity: Name: NameFull: Casalini, R IsPartOfRelationships: – BibEntity: Dates: – D: 21 M: 05 Text: 5/21/2022 Type: published Y: 2022 Identifiers: – Type: issn-print Value: 09574484 Numbering: – Type: volume Value: 33 – Type: issue Value: 21 Titles: – TitleFull: Nanotechnology Type: main |
| ResultId | 1 |
