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Structural and the optical characteristics of PbSx thin films.

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Title: Structural and the optical characteristics of PbSx thin films.
Authors: Heiba, Zein K.1 (AUTHOR) zein_kh@yahoo.com, Mohamed, Mohamed Bakr1 (AUTHOR) mbm1977@yahoo.com, El-naggar, A. M.2 (AUTHOR), Badawi, Ali3,4 (AUTHOR), Elshimy, Hassan1 (AUTHOR)
Source: Journal of Materials Science: Materials in Electronics. Oct2022, Vol. 33 Issue 29, p23270-23281. 12p.
Subjects: Thin films, Electron microscope techniques, Optical films, X-ray photoelectron spectroscopy, Grazing incidence, Photoluminescence, Optical constants
Abstract: PbSx thin films (x = 1, 0.9, 0.8, 0.7, 0.6) were prepared onto glass substrates using spin coating method. The phases developed and vacancies created in the different films were explored employing θ-θ scan X-ray diffraction, grazing incidence X-ray diffraction, and Fourier transform infrared techniques. The possibility of incorporation of oxygen in PbS lattice was also examined using X-ray photoelectron spectroscopy technique. Rietveld analysis was achieved to determine the variation in the structural and microstructural parameters of different films. The morphology and thickness of the films were explored using scanning electron microscope technique. The direct band gap transition values for PbSx films with x = 1, 0.9, 0.7 and 0.6 are 2.63, 2.85, 2.95, and 3.02 eV, respectively. The refractive indices of all films demonstrated a normal dispersion. The effect of sulfur reduction in the formed films on the optical absorbance, reflectance spectra, absorption edge, extinction coefficient, dielectric constant, photoluminescence emitted colors, and nonlinear optical parameters of the PbSx films was investigated. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Structural and the optical characteristics of PbS<subscript>x</subscript> thin films.
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  Data: <searchLink fieldCode="AR" term="%22Heiba%2C+Zein+K%2E%22">Heiba, Zein K.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> zein_kh@yahoo.com</i><br /><searchLink fieldCode="AR" term="%22Mohamed%2C+Mohamed+Bakr%22">Mohamed, Mohamed Bakr</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> mbm1977@yahoo.com</i><br /><searchLink fieldCode="AR" term="%22El-naggar%2C+A%2E+M%2E%22">El-naggar, A. M.</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Badawi%2C+Ali%22">Badawi, Ali</searchLink><relatesTo>3,4</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Elshimy%2C+Hassan%22">Elshimy, Hassan</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>. Oct2022, Vol. 33 Issue 29, p23270-23281. 12p.
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  Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+microscope+techniques%22">Electron microscope techniques</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+films%22">Optical films</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Grazing+incidence%22">Grazing incidence</searchLink><br /><searchLink fieldCode="DE" term="%22Photoluminescence%22">Photoluminescence</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+constants%22">Optical constants</searchLink>
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  Data: PbSx thin films (x = 1, 0.9, 0.8, 0.7, 0.6) were prepared onto glass substrates using spin coating method. The phases developed and vacancies created in the different films were explored employing θ-θ scan X-ray diffraction, grazing incidence X-ray diffraction, and Fourier transform infrared techniques. The possibility of incorporation of oxygen in PbS lattice was also examined using X-ray photoelectron spectroscopy technique. Rietveld analysis was achieved to determine the variation in the structural and microstructural parameters of different films. The morphology and thickness of the films were explored using scanning electron microscope technique. The direct band gap transition values for PbSx films with x = 1, 0.9, 0.7 and 0.6 are 2.63, 2.85, 2.95, and 3.02 eV, respectively. The refractive indices of all films demonstrated a normal dispersion. The effect of sulfur reduction in the formed films on the optical absorbance, reflectance spectra, absorption edge, extinction coefficient, dielectric constant, photoluminescence emitted colors, and nonlinear optical parameters of the PbSx films was investigated. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s10854-022-09093-w
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        Text: English
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        PageCount: 12
        StartPage: 23270
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      – SubjectFull: Thin films
        Type: general
      – SubjectFull: Electron microscope techniques
        Type: general
      – SubjectFull: Optical films
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      – SubjectFull: X-ray photoelectron spectroscopy
        Type: general
      – SubjectFull: Grazing incidence
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      – SubjectFull: Photoluminescence
        Type: general
      – SubjectFull: Optical constants
        Type: general
    Titles:
      – TitleFull: Structural and the optical characteristics of PbSx thin films.
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            NameFull: Heiba, Zein K.
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              M: 10
              Text: Oct2022
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              Y: 2022
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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