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Poly(vinylidene fluoride‐co‐trifluoroethylene) Thin Films after Dip‐ and Spin‐Coating.

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Title: Poly(vinylidene fluoride‐co‐trifluoroethylene) Thin Films after Dip‐ and Spin‐Coating.
Authors: Apelt, Sabine1 (AUTHOR) sabine.apelt@tu-dresden.de, Höhne, Susanne2 (AUTHOR) hoehne@ipfdd.de, Mehner, Erik3 (AUTHOR), Böhm, Carolin2 (AUTHOR), Malanin, Mikhail2 (AUTHOR), Eichhorn, Klaus‐Jochen2 (AUTHOR), Jehnichen, Dieter2 (AUTHOR), Uhlmann, Petra2 (AUTHOR), Bergmann, Ute1 (AUTHOR)
Source: Macromolecular Materials & Engineering. Oct2022, Vol. 307 Issue 10, p1-8. 8p.
Subjects: Thin films, X-ray reflectometry, Atomic force microscopy, Reflectance spectroscopy, Infrared absorption
Abstract: The ferro‐, pyro‐ and piezoelectric properties of poly(vinylidene fluoride‐co‐trifluoroethylene) P(VDF‐TrFE) have created interest with regard to its application in aqueous and ambient surroundings for sensors, functional coatings, and in the field of life sciences. P(VDF‐TrFE) thin films are usually applied via spin‐coating, but dip‐coating will be advantageous especially for irregularly shaped substrates. The morphology of dip‐ and spin‐coated semi‐crystalline thin films is studied as a function of both the film thickness and the annealing temperature. The characterization of the films is carried out by grazing incidence wide‐angle X‐ray scattering (GIWAXS), X‐ray reflectometry (XRR), and infrared reflection absorption spectroscopy (IRRAS). Atomic force microscopy measurements (AFM) are used to examine the resulting topography. It is found that both spin‐ and dip‐coated thin films crystallize in the desired edge‐on orientation, but the overall crystallinity after dip‐coating is decreased compared to the spin‐coated films of comparable thickness and the resulting roughness is increased. The higher roughness is most probably caused by the slower evaporation of the solvents and a secondary crystallization process at the air‐polymer interface. [ABSTRACT FROM AUTHOR]
Copyright of Macromolecular Materials & Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Poly(vinylidene fluoride‐co‐trifluoroethylene) Thin Films after Dip‐ and Spin‐Coating.
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  Data: <searchLink fieldCode="AR" term="%22Apelt%2C+Sabine%22">Apelt, Sabine</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> sabine.apelt@tu-dresden.de</i><br /><searchLink fieldCode="AR" term="%22Höhne%2C+Susanne%22">Höhne, Susanne</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> hoehne@ipfdd.de</i><br /><searchLink fieldCode="AR" term="%22Mehner%2C+Erik%22">Mehner, Erik</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Böhm%2C+Carolin%22">Böhm, Carolin</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Malanin%2C+Mikhail%22">Malanin, Mikhail</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Eichhorn%2C+Klaus‐Jochen%22">Eichhorn, Klaus‐Jochen</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jehnichen%2C+Dieter%22">Jehnichen, Dieter</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Uhlmann%2C+Petra%22">Uhlmann, Petra</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Bergmann%2C+Ute%22">Bergmann, Ute</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Macromolecular+Materials+%26+Engineering%22">Macromolecular Materials & Engineering</searchLink>. Oct2022, Vol. 307 Issue 10, p1-8. 8p.
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  Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+reflectometry%22">X-ray reflectometry</searchLink><br /><searchLink fieldCode="DE" term="%22Atomic+force+microscopy%22">Atomic force microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Reflectance+spectroscopy%22">Reflectance spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Infrared+absorption%22">Infrared absorption</searchLink>
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  Data: The ferro‐, pyro‐ and piezoelectric properties of poly(vinylidene fluoride‐co‐trifluoroethylene) P(VDF‐TrFE) have created interest with regard to its application in aqueous and ambient surroundings for sensors, functional coatings, and in the field of life sciences. P(VDF‐TrFE) thin films are usually applied via spin‐coating, but dip‐coating will be advantageous especially for irregularly shaped substrates. The morphology of dip‐ and spin‐coated semi‐crystalline thin films is studied as a function of both the film thickness and the annealing temperature. The characterization of the films is carried out by grazing incidence wide‐angle X‐ray scattering (GIWAXS), X‐ray reflectometry (XRR), and infrared reflection absorption spectroscopy (IRRAS). Atomic force microscopy measurements (AFM) are used to examine the resulting topography. It is found that both spin‐ and dip‐coated thin films crystallize in the desired edge‐on orientation, but the overall crystallinity after dip‐coating is decreased compared to the spin‐coated films of comparable thickness and the resulting roughness is increased. The higher roughness is most probably caused by the slower evaporation of the solvents and a secondary crystallization process at the air‐polymer interface. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Macromolecular Materials & Engineering is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1002/mame.202200296
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        Text: English
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        Type: general
      – SubjectFull: X-ray reflectometry
        Type: general
      – SubjectFull: Atomic force microscopy
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      – SubjectFull: Reflectance spectroscopy
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      – SubjectFull: Infrared absorption
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      – TitleFull: Poly(vinylidene fluoride‐co‐trifluoroethylene) Thin Films after Dip‐ and Spin‐Coating.
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            – D: 01
              M: 10
              Text: Oct2022
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