APA (7th ed.) Citation

Singh, M., Wu, Y., & Singh, J. (2005). Velocity Overshoot Effects and Scaling Is sues in III--V Nitrides. IEEE Transactions on Electron Devices, 52(3), 311. https://doi.org/10.1109/TED.2005.843966

Chicago Style (17th ed.) Citation

Singh, Madhusudan, Yuh-Renn Wu, and Jasprit Singh. "Velocity Overshoot Effects and Scaling Is Sues in III--V Nitrides." IEEE Transactions on Electron Devices 52, no. 3 (2005): 311. https://doi.org/10.1109/TED.2005.843966.

MLA (9th ed.) Citation

Singh, Madhusudan, et al. "Velocity Overshoot Effects and Scaling Is Sues in III--V Nitrides." IEEE Transactions on Electron Devices, vol. 52, no. 3, 2005, p. 311, https://doi.org/10.1109/TED.2005.843966.