Bibliographic Details
| Title: |
Removing gas-phase features in near ambient pressure partial Auger-Meitner electron yield oxygen K-edge NEXAFS spectra. |
| Authors: |
Bartels-Rausch, Thorsten1 (AUTHOR) thorsten.bartels-rausch@psi.ch, Gabathuler, Jérôme Philippe1 (AUTHOR), Yang, Huanyu1 (AUTHOR), Manoharan, Yanisha1 (AUTHOR), Artiglia, Luca1 (AUTHOR), Ammann, Markus1 (AUTHOR) |
| Source: |
Journal of Electron Spectroscopy & Related Phenomena. Apr2023, Vol. 264, pN.PAG-N.PAG. 1p. |
| Subjects: |
X-ray absorption near edge structure, Partial pressure, Partial discharges, X-ray absorption |
| Abstract: |
With the advent of ambient pressure X-ray excited electron spectroscopy, near-edge X-ray absorption fine structure spectroscopy is widely used to investigate the hydrogen-bonding environment in aqueous solutions, ice, and adsorbed water. When Auger-Meitner electrons are detected, the method becomes inherently surface-sensitive because of the limited escape depth of electrons. In such X-ray absorption experiments with aqueous samples, gas-phase water is inevitably present. It impacts the acquired spectra in two ways: (1) Absorption along the X-ray path upstream of the sample reduces the photon flux reaching the condensed phase. (2) Spectra originating from gas-phase water in front of the analyzer contribute to the recorded spectra. Here, we develop and discuss a procedure to disentangle the gas-phase and condensed-phase contribution in the acquired spectra. A novel approach to quantify and remove the gas-phase contribution allows receiving condensed-phase near-edge X-ray absorption fine structure spectra at high water vapor pressure free of gas-phase artifacts. • X-ray absorption data probing ice are impacted by the elevated partial pressure of water present. • First, photon flux reaching the sample is reduced by X-ray absorption of gas-phase water. • Second, X-ray spectra show the contribution of gas-phase water. • Both artifacts can be removed with high precision. [ABSTRACT FROM AUTHOR] |
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| Database: |
Engineering Source |