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A Multiple Objective Framework for Planning Accelerated Life Tests.

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Title: A Multiple Objective Framework for Planning Accelerated Life Tests.
Authors: Tang, Loon-Ching1 isetlc@nus.edu.sg, Xu, Kai1 kxu@ieee.org
Source: IEEE Transactions on Reliability. Mar2005, Vol. 54 Issue 1, p58-63. 6p.
Subjects: Accelerated life testing, Reliability in engineering, Testing, Systems engineering, Statistics, Mathematical models
Abstract: The article presents information related to accelerated life test (ALT). ALT is a widely used technique in industry to meet the resources, and time constraints, for revealing product weakness, and assessing the reliability of products. Some authors have considered test plans under some implicit cost constraints through the use of different censoring times at different levels of stresses, expected test time constraint, and obtaining the optimum number of test units. This article focuses on a framework with two conflicting objectives in the planning of ALT, i.e., meeting a desired level of statistical precision for an estimate of interest, and meeting a cost target for conducting the test.
Database: Engineering Source
FullText Text:
  Availability: 0
Header DbId: egs
DbLabel: Engineering Source
An: 16411457
AccessLevel: 6
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
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  Data: A Multiple Objective Framework for Planning Accelerated Life Tests.
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  Data: <searchLink fieldCode="AR" term="%22Tang%2C+Loon-Ching%22">Tang, Loon-Ching</searchLink><relatesTo>1</relatesTo><i> isetlc@nus.edu.sg</i><br /><searchLink fieldCode="AR" term="%22Xu%2C+Kai%22">Xu, Kai</searchLink><relatesTo>1</relatesTo><i> kxu@ieee.org</i>
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  Data: <searchLink fieldCode="JN" term="%22IEEE+Transactions+on+Reliability%22">IEEE Transactions on Reliability</searchLink>. Mar2005, Vol. 54 Issue 1, p58-63. 6p.
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  Data: <searchLink fieldCode="DE" term="%22Accelerated+life+testing%22">Accelerated life testing</searchLink><br /><searchLink fieldCode="DE" term="%22Reliability+in+engineering%22">Reliability in engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Testing%22">Testing</searchLink><br /><searchLink fieldCode="DE" term="%22Systems+engineering%22">Systems engineering</searchLink><br /><searchLink fieldCode="DE" term="%22Statistics%22">Statistics</searchLink><br /><searchLink fieldCode="DE" term="%22Mathematical+models%22">Mathematical models</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: The article presents information related to accelerated life test (ALT). ALT is a widely used technique in industry to meet the resources, and time constraints, for revealing product weakness, and assessing the reliability of products. Some authors have considered test plans under some implicit cost constraints through the use of different censoring times at different levels of stresses, expected test time constraint, and obtaining the optimum number of test units. This article focuses on a framework with two conflicting objectives in the planning of ALT, i.e., meeting a desired level of statistical precision for an estimate of interest, and meeting a cost target for conducting the test.
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=egs&AN=16411457
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1109/TR.2004.841731
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      – Code: eng
        Text: English
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      Pagination:
        PageCount: 6
        StartPage: 58
    Subjects:
      – SubjectFull: Accelerated life testing
        Type: general
      – SubjectFull: Reliability in engineering
        Type: general
      – SubjectFull: Testing
        Type: general
      – SubjectFull: Systems engineering
        Type: general
      – SubjectFull: Statistics
        Type: general
      – SubjectFull: Mathematical models
        Type: general
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      – TitleFull: A Multiple Objective Framework for Planning Accelerated Life Tests.
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            NameFull: Tang, Loon-Ching
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            NameFull: Xu, Kai
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            – D: 01
              M: 03
              Text: Mar2005
              Type: published
              Y: 2005
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