Investigation of MRR and surface characterization using plasma process.
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| Title: | Investigation of MRR and surface characterization using plasma process. |
|---|---|
| Authors: | Singh Yadav, Hari Narayan1 (AUTHOR), Krishna, Enni2 (AUTHOR), Kombath, Sreelakshmy2 (AUTHOR), Dev, D Sam Dayala2 (AUTHOR), Das, Manas1 (AUTHOR) manasdas@iitg.ernet.in |
| Source: | Materials & Manufacturing Processes. 2023, Vol. 38 Issue 13, p1716-1728. 13p. |
| Subjects: | Surface analysis, Plasma materials processing, Plasma pressure, Surface contamination, Surface finishing, Electrochemical cutting, Fused silica |
| Abstract: | Fused silica glass, in particular, offers a broad range of applications in optics. The present study investigates fused silica samples using non-conventional medium-pressure plasma polishing at optimum machining parameters. The polishing parameters, i.e. gas composition (He: (SF6+O2)) of 90:10, pressure ratio (SF6:O2) of 1:1, total pressure of plasma chamber of 5 mbar, and radio-frequency (RF) power of 80 W have been obtained at optimum parametric conditions. The highest material removal rate of 100.36 × 10−3 mm3/min is achieved at optimized process conditions. Even though the surface finish is slightly degraded from 0.28 µm to 0.30 µm, without any surface contamination as analyzed by the 3D optical profiler and Energy-Dispersive X-ray (EDX). Moreover, EDX analysis reveals the presence of fluorine elements after plasma processing, confirming the plasma's interaction with the substrate. Furthermore, Raman spectroscopy results show a maximum 13% reduction in damaged and strained layers after plasma processing on the machined surface.. [ABSTRACT FROM AUTHOR] |
| Copyright of Materials & Manufacturing Processes is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 172441156 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Investigation of MRR and surface characterization using plasma process. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Singh+Yadav%2C+Hari+Narayan%22">Singh Yadav, Hari Narayan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Krishna%2C+Enni%22">Krishna, Enni</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Kombath%2C+Sreelakshmy%22">Kombath, Sreelakshmy</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Dev%2C+D+Sam+Dayala%22">Dev, D Sam Dayala</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Das%2C+Manas%22">Das, Manas</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> manasdas@iitg.ernet.in</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Materials+%26+Manufacturing+Processes%22">Materials & Manufacturing Processes</searchLink>. 2023, Vol. 38 Issue 13, p1716-1728. 13p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Surface+analysis%22">Surface analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Plasma+materials+processing%22">Plasma materials processing</searchLink><br /><searchLink fieldCode="DE" term="%22Plasma+pressure%22">Plasma pressure</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+contamination%22">Surface contamination</searchLink><br /><searchLink fieldCode="DE" term="%22Surface+finishing%22">Surface finishing</searchLink><br /><searchLink fieldCode="DE" term="%22Electrochemical+cutting%22">Electrochemical cutting</searchLink><br /><searchLink fieldCode="DE" term="%22Fused+silica%22">Fused silica</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Fused silica glass, in particular, offers a broad range of applications in optics. The present study investigates fused silica samples using non-conventional medium-pressure plasma polishing at optimum machining parameters. The polishing parameters, i.e. gas composition (He: (SF6+O2)) of 90:10, pressure ratio (SF6:O2) of 1:1, total pressure of plasma chamber of 5 mbar, and radio-frequency (RF) power of 80 W have been obtained at optimum parametric conditions. The highest material removal rate of 100.36 × 10−3 mm3/min is achieved at optimized process conditions. Even though the surface finish is slightly degraded from 0.28 µm to 0.30 µm, without any surface contamination as analyzed by the 3D optical profiler and Energy-Dispersive X-ray (EDX). Moreover, EDX analysis reveals the presence of fluorine elements after plasma processing, confirming the plasma's interaction with the substrate. Furthermore, Raman spectroscopy results show a maximum 13% reduction in damaged and strained layers after plasma processing on the machined surface.. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Materials & Manufacturing Processes is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1080/10426914.2023.2176873 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 1716 Subjects: – SubjectFull: Surface analysis Type: general – SubjectFull: Plasma materials processing Type: general – SubjectFull: Plasma pressure Type: general – SubjectFull: Surface contamination Type: general – SubjectFull: Surface finishing Type: general – SubjectFull: Electrochemical cutting Type: general – SubjectFull: Fused silica Type: general Titles: – TitleFull: Investigation of MRR and surface characterization using plasma process. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Singh Yadav, Hari Narayan – PersonEntity: Name: NameFull: Krishna, Enni – PersonEntity: Name: NameFull: Kombath, Sreelakshmy – PersonEntity: Name: NameFull: Dev, D Sam Dayala – PersonEntity: Name: NameFull: Das, Manas IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 09 Text: 2023 Type: published Y: 2023 Identifiers: – Type: issn-print Value: 10426914 Numbering: – Type: volume Value: 38 – Type: issue Value: 13 Titles: – TitleFull: Materials & Manufacturing Processes Type: main |
| ResultId | 1 |