Analysis of Hazy Ga- and Zr-Co-Doped Zinc Oxide Films Prepared with Atmospheric Pressure Plasma Jet Systems.
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| Title: | Analysis of Hazy Ga- and Zr-Co-Doped Zinc Oxide Films Prepared with Atmospheric Pressure Plasma Jet Systems. |
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| Authors: | Luo, Yu-Tang1 (AUTHOR) r09522552@ntu.edu.tw, Zhou, Zhehan1 (AUTHOR) r10522549@ntu.edu.tw, Wu, Cheng-Yang1 (AUTHOR) r09522520@ntu.edu.tw, Chiu, Li-Ching1 (AUTHOR) r09522531@ntu.edu.tw, Juang, Jia-Yang1,2 (AUTHOR) jiayang@ntu.edu.tw |
| Source: | Nanomaterials (2079-4991). Oct2023, Vol. 13 Issue 19, p2691. 13p. |
| Subjects: | Plasma jets, Atmospheric pressure, Zinc oxide films, Zinc oxide thin films, Thin films, Transparent electronics, Electrical resistivity |
| Abstract: | Co-doped ZnO thin films have attracted much attention in the field of transparent conductive oxides (TCOs) in solar cells, displays, and other transparent electronics. Unlike conventional single-doped ZnO, co-doped ZnO utilizes two different dopant elements, offering enhanced electrical properties and more controllable optical properties, including transmittance and haze; however, most previous studies focused on the electrical properties, with less attention paid to obtaining high haze using co-doping. Here, we prepare high-haze Ga- and Zr-co-doped ZnO (GZO:Zr or ZGZO) using atmospheric pressure plasma jet (APPJ) systems. We conduct a detailed analysis to examine the interplay between Zr concentrations and film properties. UV-Vis spectroscopy shows a remarkable haze factor increase of 7.19% to 34.8% (+384%) for the films prepared with 2 at% Zr and 8 at% Ga precursor concentrations. EDS analysis reveals Zr accumulation on larger and smaller particles, while SIMS links particle abundance to impurity uptake and altered electrical properties. XPS identifies Zr mainly as ZrO2 because of lattice stress from Zr doping, forming clusters at lattice boundaries and corroborating the SEM findings. Our work presents a new way to fabricate Ga- and Zr-co-doped ZnO for applications that require low electrical resistivity, high visible transparency, and high haze. [ABSTRACT FROM AUTHOR] |
| Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
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| Items | – Name: Title Label: Title Group: Ti Data: Analysis of Hazy Ga- and Zr-Co-Doped Zinc Oxide Films Prepared with Atmospheric Pressure Plasma Jet Systems. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Luo%2C+Yu-Tang%22">Luo, Yu-Tang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> r09522552@ntu.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Zhou%2C+Zhehan%22">Zhou, Zhehan</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> r10522549@ntu.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Wu%2C+Cheng-Yang%22">Wu, Cheng-Yang</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> r09522520@ntu.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Chiu%2C+Li-Ching%22">Chiu, Li-Ching</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> r09522531@ntu.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Juang%2C+Jia-Yang%22">Juang, Jia-Yang</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> jiayang@ntu.edu.tw</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Nanomaterials+%282079-4991%29%22">Nanomaterials (2079-4991)</searchLink>. Oct2023, Vol. 13 Issue 19, p2691. 13p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Plasma+jets%22">Plasma jets</searchLink><br /><searchLink fieldCode="DE" term="%22Atmospheric+pressure%22">Atmospheric pressure</searchLink><br /><searchLink fieldCode="DE" term="%22Zinc+oxide+films%22">Zinc oxide films</searchLink><br /><searchLink fieldCode="DE" term="%22Zinc+oxide+thin+films%22">Zinc oxide thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Transparent+electronics%22">Transparent electronics</searchLink><br /><searchLink fieldCode="DE" term="%22Electrical+resistivity%22">Electrical resistivity</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: Co-doped ZnO thin films have attracted much attention in the field of transparent conductive oxides (TCOs) in solar cells, displays, and other transparent electronics. Unlike conventional single-doped ZnO, co-doped ZnO utilizes two different dopant elements, offering enhanced electrical properties and more controllable optical properties, including transmittance and haze; however, most previous studies focused on the electrical properties, with less attention paid to obtaining high haze using co-doping. Here, we prepare high-haze Ga- and Zr-co-doped ZnO (GZO:Zr or ZGZO) using atmospheric pressure plasma jet (APPJ) systems. We conduct a detailed analysis to examine the interplay between Zr concentrations and film properties. UV-Vis spectroscopy shows a remarkable haze factor increase of 7.19% to 34.8% (+384%) for the films prepared with 2 at% Zr and 8 at% Ga precursor concentrations. EDS analysis reveals Zr accumulation on larger and smaller particles, while SIMS links particle abundance to impurity uptake and altered electrical properties. XPS identifies Zr mainly as ZrO2 because of lattice stress from Zr doping, forming clusters at lattice boundaries and corroborating the SEM findings. Our work presents a new way to fabricate Ga- and Zr-co-doped ZnO for applications that require low electrical resistivity, high visible transparency, and high haze. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Nanomaterials (2079-4991) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/nano13192691 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 2691 Subjects: – SubjectFull: Plasma jets Type: general – SubjectFull: Atmospheric pressure Type: general – SubjectFull: Zinc oxide films Type: general – SubjectFull: Zinc oxide thin films Type: general – SubjectFull: Thin films Type: general – SubjectFull: Transparent electronics Type: general – SubjectFull: Electrical resistivity Type: general Titles: – TitleFull: Analysis of Hazy Ga- and Zr-Co-Doped Zinc Oxide Films Prepared with Atmospheric Pressure Plasma Jet Systems. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Luo, Yu-Tang – PersonEntity: Name: NameFull: Zhou, Zhehan – PersonEntity: Name: NameFull: Wu, Cheng-Yang – PersonEntity: Name: NameFull: Chiu, Li-Ching – PersonEntity: Name: NameFull: Juang, Jia-Yang IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: Oct2023 Type: published Y: 2023 Identifiers: – Type: issn-print Value: 20794991 Numbering: – Type: volume Value: 13 – Type: issue Value: 19 Titles: – TitleFull: Nanomaterials (2079-4991) Type: main |
| ResultId | 1 |