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Complex material analysis of a TiC coating produced by hot pressing with optical light microscopy, EDS, XRD, GDOES and EBSD.

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Title: Complex material analysis of a TiC coating produced by hot pressing with optical light microscopy, EDS, XRD, GDOES and EBSD.
Authors: Grad, Marius1,2 (AUTHOR) marius.grad@tu-ilmenau.de, Honig, Hauke1 (AUTHOR), Diemar, Andreas1,3 (AUTHOR), Flock, Dominik1 (AUTHOR), Spieß, Lothar1 (AUTHOR)
Source: Surface & Coatings Technology. Jan2024, Vol. 476, pN.PAG-N.PAG. 1p.
Subjects: X-ray diffraction, Materials analysis, Microscopy, Titanium carbide, Rietveld refinement, Carbon steel
Abstract: The present study investigates the interface between carbon steel and titanium samples annealed at different temperatures (ϑ 1 = ▪ and ϑ 2 = ▪). In both cases, an observable layer forms at the interface, with its thickness increasing from t ϑ 1 = 2.75 ± ▪ at ▪ to t ϑ 2 = 8.86 ± ▪ at ▪. The layer's composition and thickness evolve with temperature. Analysis reveals approximately 40 at.-% carbon concentration in the exterior region, indicating likely titanium carbide creation. X-ray diffraction identifies titanium carbide peaks, while microscopy and elemental mapping confirm compositional gradients at the interface. Electron Backscatter Diffraction (EBSD) shows a gradient in grain size near the TiC surface, reflecting TiC nucleation rates. XRD data detect both titanium carbide and titanium phases, with TiC becoming more prominent at ▪. Rietveld analysis further confirms TiC formation. Notably, distinct diffraction patterns on the contact and rear sides suggest a Ti(C, O, N) presence. Depth profiles exhibit varying surface and depth carbon concentrations, attributed to temperature effects. The study successfully demonstrates TiC coating fabrication through hot pressing, wherein Ti(C, O, N) coatings arise from titanium's affinity for reacting with oxygen and nitrogen. This research contributes to the understanding of phase transformations and interfacial properties in titanium-carbon steel systems. • Hot pressing provides a simple method for creating a TiC film on Ti substrates. • Theoretical considerations are proven by investigations with EDS, XRD, GDOES, EBSD. • EBSD analyses confirm a graded microstructure within the layer. • GDOES and EDS measurements indicate oxygen and nitrogen on the surface. • XRD verifies the presence of TiC and Ti(C,O,N), matching the element distribution. [ABSTRACT FROM AUTHOR]
Copyright of Surface & Coatings Technology is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Label: Title
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  Data: Complex material analysis of a TiC coating produced by hot pressing with optical light microscopy, EDS, XRD, GDOES and EBSD.
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  Data: <searchLink fieldCode="AR" term="%22Grad%2C+Marius%22">Grad, Marius</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> marius.grad@tu-ilmenau.de</i><br /><searchLink fieldCode="AR" term="%22Honig%2C+Hauke%22">Honig, Hauke</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Diemar%2C+Andreas%22">Diemar, Andreas</searchLink><relatesTo>1,3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Flock%2C+Dominik%22">Flock, Dominik</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Spieß%2C+Lothar%22">Spieß, Lothar</searchLink><relatesTo>1</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="DE" term="%22X-ray+diffraction%22">X-ray diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Materials+analysis%22">Materials analysis</searchLink><br /><searchLink fieldCode="DE" term="%22Microscopy%22">Microscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Titanium+carbide%22">Titanium carbide</searchLink><br /><searchLink fieldCode="DE" term="%22Rietveld+refinement%22">Rietveld refinement</searchLink><br /><searchLink fieldCode="DE" term="%22Carbon+steel%22">Carbon steel</searchLink>
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  Label: Abstract
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  Data: The present study investigates the interface between carbon steel and titanium samples annealed at different temperatures (ϑ 1 = ▪ and ϑ 2 = ▪). In both cases, an observable layer forms at the interface, with its thickness increasing from t ϑ 1 = 2.75 ± ▪ at ▪ to t ϑ 2 = 8.86 ± ▪ at ▪. The layer's composition and thickness evolve with temperature. Analysis reveals approximately 40 at.-% carbon concentration in the exterior region, indicating likely titanium carbide creation. X-ray diffraction identifies titanium carbide peaks, while microscopy and elemental mapping confirm compositional gradients at the interface. Electron Backscatter Diffraction (EBSD) shows a gradient in grain size near the TiC surface, reflecting TiC nucleation rates. XRD data detect both titanium carbide and titanium phases, with TiC becoming more prominent at ▪. Rietveld analysis further confirms TiC formation. Notably, distinct diffraction patterns on the contact and rear sides suggest a Ti(C, O, N) presence. Depth profiles exhibit varying surface and depth carbon concentrations, attributed to temperature effects. The study successfully demonstrates TiC coating fabrication through hot pressing, wherein Ti(C, O, N) coatings arise from titanium's affinity for reacting with oxygen and nitrogen. This research contributes to the understanding of phase transformations and interfacial properties in titanium-carbon steel systems. • Hot pressing provides a simple method for creating a TiC film on Ti substrates. • Theoretical considerations are proven by investigations with EDS, XRD, GDOES, EBSD. • EBSD analyses confirm a graded microstructure within the layer. • GDOES and EDS measurements indicate oxygen and nitrogen on the surface. • XRD verifies the presence of TiC and Ti(C,O,N), matching the element distribution. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Surface & Coatings Technology is the property of Elsevier B.V. and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Type: doi
        Value: 10.1016/j.surfcoat.2023.130265
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      – Code: eng
        Text: English
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        PageCount: 1
        StartPage: N.PAG
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      – SubjectFull: X-ray diffraction
        Type: general
      – SubjectFull: Materials analysis
        Type: general
      – SubjectFull: Microscopy
        Type: general
      – SubjectFull: Titanium carbide
        Type: general
      – SubjectFull: Rietveld refinement
        Type: general
      – SubjectFull: Carbon steel
        Type: general
    Titles:
      – TitleFull: Complex material analysis of a TiC coating produced by hot pressing with optical light microscopy, EDS, XRD, GDOES and EBSD.
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            NameFull: Grad, Marius
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            NameFull: Honig, Hauke
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              M: 01
              Text: Jan2024
              Type: published
              Y: 2024
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              Value: 476
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