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Study of local piezo and ferroelectric characteristics of PVDF + Bi25FeO40 composite nanodots using piezoforce microscopy.

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Title: Study of local piezo and ferroelectric characteristics of PVDF + Bi25FeO40 composite nanodots using piezoforce microscopy.
Authors: Ravisankar, M. S.1 (AUTHOR) ravisankarms.sse@saveetha.com, Rasi, U. P. Mohammed2 (AUTHOR)
Source: Journal of Materials Science: Materials in Electronics. Feb2024, Vol. 35 Issue 4, p1-11. 11p.
Abstract: The enhancement of Piezo response and local ferroelectric behavior of PVDF-Bi25FeO40 composite thin films are investigated using piezo force microscopy (PFM) technique. The self-assembled composite nanodots thin films are prepared by spin coater with PVDF and Bi25FeO40 nano powder solution mixture. The structural and morphology characteristics are analyzed by FTIR-ATR and Atomic force microscopy. The surface microstructure, confined domain structure, its piezo, ferro electricity behavior, its corresponding d33 coefficient are explored with PFM under no poling and poling with external DC bias, AC bias and various drive frequencies. The d33 coefficient varies from 14 to 17 pm/V by adding of 5 wt% of Bi25FeO40 to PVDF than pristine PVDF nanodots made under same condition. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Study of local piezo and ferroelectric characteristics of PVDF + Bi<subscript>25</subscript>FeO<subscript>40</subscript> composite nanodots using piezoforce microscopy.
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  Data: <searchLink fieldCode="AR" term="%22Ravisankar%2C+M%2E+S%2E%22">Ravisankar, M. S.</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> ravisankarms.sse@saveetha.com</i><br /><searchLink fieldCode="AR" term="%22Rasi%2C+U%2E+P%2E+Mohammed%22">Rasi, U. P. Mohammed</searchLink><relatesTo>2</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>. Feb2024, Vol. 35 Issue 4, p1-11. 11p.
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: The enhancement of Piezo response and local ferroelectric behavior of PVDF-Bi25FeO40 composite thin films are investigated using piezo force microscopy (PFM) technique. The self-assembled composite nanodots thin films are prepared by spin coater with PVDF and Bi25FeO40 nano powder solution mixture. The structural and morphology characteristics are analyzed by FTIR-ATR and Atomic force microscopy. The surface microstructure, confined domain structure, its piezo, ferro electricity behavior, its corresponding d33 coefficient are explored with PFM under no poling and poling with external DC bias, AC bias and various drive frequencies. The d33 coefficient varies from 14 to 17 pm/V by adding of 5 wt% of Bi25FeO40 to PVDF than pristine PVDF nanodots made under same condition. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Materials Science: Materials in Electronics is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s10854-024-12038-0
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              Text: Feb2024
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