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Spectroscopic analysis and thermoelectric properties of ITO/Cu/Ni/ITO multilayer by RF sputtering.

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Title: Spectroscopic analysis and thermoelectric properties of ITO/Cu/Ni/ITO multilayer by RF sputtering.
Authors: Tchenka, Abdelaziz1 (AUTHOR) abdelaziz.tchenka@gmail.com, Agdad, Abdelali1 (AUTHOR), Amiri, Lahoucine1 (AUTHOR), Bousseta, Mohammed1 (AUTHOR), El Mouncharih, Abdelkarim1 (AUTHOR), Elmassi, Said1 (AUTHOR), Nkhaili, Lahcen1 (AUTHOR), Ech-Chamikh, Elmaati1 (AUTHOR)
Source: Applied Physics A: Materials Science & Processing. May2024, Vol. 130 Issue 5, p1-8. 8p.
Subjects: Thermoelectric materials, Radiofrequency sputtering, Copper, Seebeck coefficient, Optical glass, Multilayered thin films
Abstract: In this paper, we present the effects of annealing in a vacuum on the structural, electrical, thermoelectric, optical and properties of a glass/ITO (40 nm)/Cu (5 nm)/Ni (10 nm)/ITO (40 nm) multilayer prepared on glass substrates at room temperature using the Radio Frequency (RF) sputtering technique. The effect of annealing in a vacuum is investigated. The structures of the ICNI were analyzed using X-Ray Reflectivity (XRR) and X-Ray Diffraction (XRD). Furthermore, the electrical and optical properties were characterized using the four-point probe measurement method and a UV–Vis-NIR spectrometer, respectively. The influence of the annealing temperature in a vacuum on transmittance, structural integrity, electrical behavior, energy band gap, resistivity, Seebeck coefficient, and figure of merit were investigated. [ABSTRACT FROM AUTHOR]
Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Spectroscopic analysis and thermoelectric properties of ITO/Cu/Ni/ITO multilayer by RF sputtering.
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  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+A%3A+Materials+Science+%26+Processing%22">Applied Physics A: Materials Science & Processing</searchLink>. May2024, Vol. 130 Issue 5, p1-8. 8p.
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  Data: In this paper, we present the effects of annealing in a vacuum on the structural, electrical, thermoelectric, optical and properties of a glass/ITO (40 nm)/Cu (5 nm)/Ni (10 nm)/ITO (40 nm) multilayer prepared on glass substrates at room temperature using the Radio Frequency (RF) sputtering technique. The effect of annealing in a vacuum is investigated. The structures of the ICNI were analyzed using X-Ray Reflectivity (XRR) and X-Ray Diffraction (XRD). Furthermore, the electrical and optical properties were characterized using the four-point probe measurement method and a UV–Vis-NIR spectrometer, respectively. The influence of the annealing temperature in a vacuum on transmittance, structural integrity, electrical behavior, energy band gap, resistivity, Seebeck coefficient, and figure of merit were investigated. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Applied Physics A: Materials Science & Processing is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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              Text: May2024
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