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Calibration and error analysis of an arc detector for wide-angle X-ray scattering (WAXS).

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Title: Calibration and error analysis of an arc detector for wide-angle X-ray scattering (WAXS).
Authors: Shang, Xiaoxia1,2 (AUTHOR), Chen, Rongchao3 (AUTHOR), Wu, Haijuan2 (AUTHOR), Fan, Yueqian1,2 (AUTHOR), Wang, Meijun1 (AUTHOR) wangmeijun@tyut.edu.cn, Li, Zhihong2 (AUTHOR) lzh@ihep.ac.cn, Chang, Liping1 (AUTHOR), Chen, Jiangang4 (AUTHOR)
Source: Instrumentation Science & Technology. 2024, Vol. 52 Issue 4, p385-400. 16p.
Subjects: X-ray scattering, Diffractive scattering, Detectors, Calibration
Abstract: In wide-angle X-ray scattering (WAXS) experiments, the use of a one-dimensional arc detector can effectively expand the angle range of collected diffraction or scattering signals. In practice, the relative positions between the centers of arc detector, sample and beam spot may overlap or misalign. Therefore, it is necessary to calibrate the instrument parameters and detection angle of the arc detector. The calibration is routinely performed by standard samples. In this contribution, the equations for angle calibration and error evaluation are constructed based on three standard diffraction peaks, and the corresponding simulation and experiment are performed to verify the feasibility of the calibration. The results indicate that the larger the coverage and the more uniform the dispersion of the three standard diffraction peaks distributed on the detector, the smaller the calibration error. [ABSTRACT FROM AUTHOR]
Copyright of Instrumentation Science & Technology is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
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PubTypeId: academicJournal
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  Label: Title
  Group: Ti
  Data: Calibration and error analysis of an arc detector for wide-angle X-ray scattering (WAXS).
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  Data: <searchLink fieldCode="AR" term="%22Shang%2C+Xiaoxia%22">Shang, Xiaoxia</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Rongchao%22">Chen, Rongchao</searchLink><relatesTo>3</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wu%2C+Haijuan%22">Wu, Haijuan</searchLink><relatesTo>2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Fan%2C+Yueqian%22">Fan, Yueqian</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Wang%2C+Meijun%22">Wang, Meijun</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> wangmeijun@tyut.edu.cn</i><br /><searchLink fieldCode="AR" term="%22Li%2C+Zhihong%22">Li, Zhihong</searchLink><relatesTo>2</relatesTo> (AUTHOR)<i> lzh@ihep.ac.cn</i><br /><searchLink fieldCode="AR" term="%22Chang%2C+Liping%22">Chang, Liping</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chen%2C+Jiangang%22">Chen, Jiangang</searchLink><relatesTo>4</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Instrumentation+Science+%26+Technology%22">Instrumentation Science & Technology</searchLink>. 2024, Vol. 52 Issue 4, p385-400. 16p.
– Name: Subject
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  Data: <searchLink fieldCode="DE" term="%22X-ray+scattering%22">X-ray scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Diffractive+scattering%22">Diffractive scattering</searchLink><br /><searchLink fieldCode="DE" term="%22Detectors%22">Detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Calibration%22">Calibration</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: In wide-angle X-ray scattering (WAXS) experiments, the use of a one-dimensional arc detector can effectively expand the angle range of collected diffraction or scattering signals. In practice, the relative positions between the centers of arc detector, sample and beam spot may overlap or misalign. Therefore, it is necessary to calibrate the instrument parameters and detection angle of the arc detector. The calibration is routinely performed by standard samples. In this contribution, the equations for angle calibration and error evaluation are constructed based on three standard diffraction peaks, and the corresponding simulation and experiment are performed to verify the feasibility of the calibration. The results indicate that the larger the coverage and the more uniform the dispersion of the three standard diffraction peaks distributed on the detector, the smaller the calibration error. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Instrumentation Science & Technology is the property of Taylor & Francis Ltd and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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        Value: 10.1080/10739149.2023.2280188
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        Text: English
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      – SubjectFull: X-ray scattering
        Type: general
      – SubjectFull: Diffractive scattering
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      – SubjectFull: Detectors
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      – SubjectFull: Calibration
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            NameFull: Shang, Xiaoxia
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            NameFull: Chen, Rongchao
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            NameFull: Wu, Haijuan
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            NameFull: Fan, Yueqian
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            NameFull: Li, Zhihong
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            NameFull: Chang, Liping
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            NameFull: Chen, Jiangang
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            – D: 01
              M: 07
              Text: 2024
              Type: published
              Y: 2024
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