Oxidation Performance of Nano-Layered (AlTiZrHfTa)N x /SiN x Coatings Deposited by Reactive Magnetron Sputtering.
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| Title: | Oxidation Performance of Nano-Layered (AlTiZrHfTa)N x /SiN x Coatings Deposited by Reactive Magnetron Sputtering. |
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| Authors: | Touaibia, Djallel Eddine1,2 (AUTHOR) djallel_eddine.touaibia@utt.fr, Achache, Sofiane1,2 (AUTHOR) abdelhakim.bouissil@utt.fr, Bouissil, Abdelhakim1,2 (AUTHOR) fabrice.parent@utt.fr, Parent, Fabrice1,2 (AUTHOR) frederic.sanchette@utt.fr, Ghanbaja, Jaafar3 (AUTHOR) jaafar.ghanbaja@univ-lorraine.fr, Gorbunova, Alina4 (AUTHOR) aag84@tpu.ru, Postnikov, Pavel S.4 (AUTHOR) pavelpostnikov@gmail.com, Chehimi, Mohamed Mehdi5 (AUTHOR) mmchehimi@yahoo.fr, Schuster, Frederic6 (AUTHOR) frederic.schuster@cea.fr, Sanchette, Frederic1,2 (AUTHOR), El Garah, Mohamed1,2 (AUTHOR) djallel_eddine.touaibia@utt.fr |
| Source: | Materials (1996-1944). Jun2024, Vol. 17 Issue 12, p2799. 21p. |
| Subjects: | Reactive sputtering, Magnetron sputtering, Refractory coating, DC sputtering, Field emission electron microscopy |
| Abstract: | This work uses the direct current magnetron sputtering (DCMS) of equi-atomic (AlTiZrHfTa) and Si targets in dynamic sweep mode to deposit nano-layered (AlTiZrHfTa)Nx/SiNx refractory high-entropy coatings (RHECs). Transmission electron microscopy (TEM), field emission scanning electron microscopy (FESEM), thermogravimetric analysis (TGA), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) are used to investigate the effect of Si addition on the oxidation behavior of the nano-layered coatings. The Si-free nitride coating exhibits FCC structure and columnar morphology, while the Si-doped nitride coatings present a FCC (AlTiZrHfTa)N/amorphous-SiNx nano-layered architecture. The hardness decreases from 24.3 ± 1.0 GPa to 17.5 ± 1.0 GPa because of the nano-layered architecture, whilst Young's modulus reduces from 188.0 ± 1.0 GPa to roughly 162.4 ± 1.0 GPa. By increasing the thickness of the SiNx nano-layer, kp values decrease significantly from 3.36 × 10−8 g2 cm−4 h−1 to 6.06 × 10−9 g2 cm−4 h−1. The activation energy increases from 90.8 kJ·mol−1 for (AlTiZrHfTa)Nx nitride coating to 126.52 kJ·mol−1 for the (AlTiZrHfTa)Nx/SiNx nano-layered coating. The formation of a FCC (AlTiZrHfTa)-Nx/a-SiNx nano-layered architecture results in the improvement of the resistance to oxidation at high temperature. [ABSTRACT FROM AUTHOR] |
| Copyright of Materials (1996-1944) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 178191153 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Oxidation Performance of Nano-Layered (AlTiZrHfTa)N x /SiN x Coatings Deposited by Reactive Magnetron Sputtering. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Touaibia%2C+Djallel+Eddine%22">Touaibia, Djallel Eddine</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> djallel_eddine.touaibia@utt.fr</i><br /><searchLink fieldCode="AR" term="%22Achache%2C+Sofiane%22">Achache, Sofiane</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> abdelhakim.bouissil@utt.fr</i><br /><searchLink fieldCode="AR" term="%22Bouissil%2C+Abdelhakim%22">Bouissil, Abdelhakim</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> fabrice.parent@utt.fr</i><br /><searchLink fieldCode="AR" term="%22Parent%2C+Fabrice%22">Parent, Fabrice</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> frederic.sanchette@utt.fr</i><br /><searchLink fieldCode="AR" term="%22Ghanbaja%2C+Jaafar%22">Ghanbaja, Jaafar</searchLink><relatesTo>3</relatesTo> (AUTHOR)<i> jaafar.ghanbaja@univ-lorraine.fr</i><br /><searchLink fieldCode="AR" term="%22Gorbunova%2C+Alina%22">Gorbunova, Alina</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> aag84@tpu.ru</i><br /><searchLink fieldCode="AR" term="%22Postnikov%2C+Pavel+S%2E%22">Postnikov, Pavel S.</searchLink><relatesTo>4</relatesTo> (AUTHOR)<i> pavelpostnikov@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Chehimi%2C+Mohamed+Mehdi%22">Chehimi, Mohamed Mehdi</searchLink><relatesTo>5</relatesTo> (AUTHOR)<i> mmchehimi@yahoo.fr</i><br /><searchLink fieldCode="AR" term="%22Schuster%2C+Frederic%22">Schuster, Frederic</searchLink><relatesTo>6</relatesTo> (AUTHOR)<i> frederic.schuster@cea.fr</i><br /><searchLink fieldCode="AR" term="%22Sanchette%2C+Frederic%22">Sanchette, Frederic</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22El+Garah%2C+Mohamed%22">El Garah, Mohamed</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<i> djallel_eddine.touaibia@utt.fr</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Materials+%281996-1944%29%22">Materials (1996-1944)</searchLink>. Jun2024, Vol. 17 Issue 12, p2799. 21p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Reactive+sputtering%22">Reactive sputtering</searchLink><br /><searchLink fieldCode="DE" term="%22Magnetron+sputtering%22">Magnetron sputtering</searchLink><br /><searchLink fieldCode="DE" term="%22Refractory+coating%22">Refractory coating</searchLink><br /><searchLink fieldCode="DE" term="%22DC+sputtering%22">DC sputtering</searchLink><br /><searchLink fieldCode="DE" term="%22Field+emission+electron+microscopy%22">Field emission electron microscopy</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: This work uses the direct current magnetron sputtering (DCMS) of equi-atomic (AlTiZrHfTa) and Si targets in dynamic sweep mode to deposit nano-layered (AlTiZrHfTa)Nx/SiNx refractory high-entropy coatings (RHECs). Transmission electron microscopy (TEM), field emission scanning electron microscopy (FESEM), thermogravimetric analysis (TGA), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) are used to investigate the effect of Si addition on the oxidation behavior of the nano-layered coatings. The Si-free nitride coating exhibits FCC structure and columnar morphology, while the Si-doped nitride coatings present a FCC (AlTiZrHfTa)N/amorphous-SiNx nano-layered architecture. The hardness decreases from 24.3 ± 1.0 GPa to 17.5 ± 1.0 GPa because of the nano-layered architecture, whilst Young's modulus reduces from 188.0 ± 1.0 GPa to roughly 162.4 ± 1.0 GPa. By increasing the thickness of the SiNx nano-layer, kp values decrease significantly from 3.36 × 10−8 g2 cm−4 h−1 to 6.06 × 10−9 g2 cm−4 h−1. The activation energy increases from 90.8 kJ·mol−1 for (AlTiZrHfTa)Nx nitride coating to 126.52 kJ·mol−1 for the (AlTiZrHfTa)Nx/SiNx nano-layered coating. The formation of a FCC (AlTiZrHfTa)-Nx/a-SiNx nano-layered architecture results in the improvement of the resistance to oxidation at high temperature. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Materials (1996-1944) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/ma17122799 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 21 StartPage: 2799 Subjects: – SubjectFull: Reactive sputtering Type: general – SubjectFull: Magnetron sputtering Type: general – SubjectFull: Refractory coating Type: general – SubjectFull: DC sputtering Type: general – SubjectFull: Field emission electron microscopy Type: general Titles: – TitleFull: Oxidation Performance of Nano-Layered (AlTiZrHfTa)N x /SiN x Coatings Deposited by Reactive Magnetron Sputtering. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Touaibia, Djallel Eddine – PersonEntity: Name: NameFull: Achache, Sofiane – PersonEntity: Name: NameFull: Bouissil, Abdelhakim – PersonEntity: Name: NameFull: Parent, Fabrice – PersonEntity: Name: NameFull: Ghanbaja, Jaafar – PersonEntity: Name: NameFull: Gorbunova, Alina – PersonEntity: Name: NameFull: Postnikov, Pavel S. – PersonEntity: Name: NameFull: Chehimi, Mohamed Mehdi – PersonEntity: Name: NameFull: Schuster, Frederic – PersonEntity: Name: NameFull: Sanchette, Frederic – PersonEntity: Name: NameFull: El Garah, Mohamed IsPartOfRelationships: – BibEntity: Dates: – D: 15 M: 06 Text: Jun2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 19961944 Numbering: – Type: volume Value: 17 – Type: issue Value: 12 Titles: – TitleFull: Materials (1996-1944) Type: main |
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