APA (7th ed.) Citation

Mendoza‐Sánchez, B., Fernandez, V., Bargiela, P., Fairley, N., & Baltrusaitis, J. (2024). Surface science insight note: Charge compensation and charge correction in X‐ray photoelectron spectroscopy. Surface & Interface Analysis: SIA, 56(8), 525. https://doi.org/10.1002/sia.7309

Chicago Style (17th ed.) Citation

Mendoza‐Sánchez, Beatriz, Vincent Fernandez, Pascal Bargiela, Neal Fairley, and Jonas Baltrusaitis. "Surface Science Insight Note: Charge Compensation and Charge Correction in X‐ray Photoelectron Spectroscopy." Surface & Interface Analysis: SIA 56, no. 8 (2024): 525. https://doi.org/10.1002/sia.7309.

MLA (9th ed.) Citation

Mendoza‐Sánchez, Beatriz, et al. "Surface Science Insight Note: Charge Compensation and Charge Correction in X‐ray Photoelectron Spectroscopy." Surface & Interface Analysis: SIA, vol. 56, no. 8, 2024, p. 525, https://doi.org/10.1002/sia.7309.