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Surface science insight note: Charge compensation and charge correction in X‐ray photoelectron spectroscopy.

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Title: Surface science insight note: Charge compensation and charge correction in X‐ray photoelectron spectroscopy.
Authors: Mendoza‐Sánchez, Beatriz1 (AUTHOR) beatriz.sanchez.wa@gmail.com, Fernandez, Vincent2 (AUTHOR), Bargiela, Pascal3,4 (AUTHOR), Fairley, Neal5 (AUTHOR), Baltrusaitis, Jonas6 (AUTHOR) job314@lehigh.edu
Source: Surface & Interface Analysis: SIA. Aug2024, Vol. 56 Issue 8, p525-531. 7p.
Subjects: X-ray photoelectron spectroscopy, Electron cloud effect
Abstract: Strategies to deal with sample charging effects on X‐ray photoelectron spectroscopy (XPS) spectra are presented. These strategies combine charge compensation (or lack of) via a flow of electrons and an electrical connection (or lack of) of samples to the ground. Practical examples involving samples with a range of different electrical properties, sample structure/composition and sensitivity to X‐rays, illustrate the correlation between sample properties, measurement strategies, and the resulting XPS data. The most appropriate measurement strategy for a particular sample is also recommended. We highlight the crucial importance of appropriate XPS data acquisition to obtain a correct data interpretation. [ABSTRACT FROM AUTHOR]
Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Surface science insight note: Charge compensation and charge correction in X‐ray photoelectron spectroscopy.
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  Data: <searchLink fieldCode="JN" term="%22Surface+%26+Interface+Analysis%3A+SIA%22">Surface & Interface Analysis: SIA</searchLink>. Aug2024, Vol. 56 Issue 8, p525-531. 7p.
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  Data: <searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Electron+cloud+effect%22">Electron cloud effect</searchLink>
– Name: Abstract
  Label: Abstract
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  Data: Strategies to deal with sample charging effects on X‐ray photoelectron spectroscopy (XPS) spectra are presented. These strategies combine charge compensation (or lack of) via a flow of electrons and an electrical connection (or lack of) of samples to the ground. Practical examples involving samples with a range of different electrical properties, sample structure/composition and sensitivity to X‐rays, illustrate the correlation between sample properties, measurement strategies, and the resulting XPS data. The most appropriate measurement strategy for a particular sample is also recommended. We highlight the crucial importance of appropriate XPS data acquisition to obtain a correct data interpretation. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
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  Data: <i>Copyright of Surface & Interface Analysis: SIA is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1002/sia.7309
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        Text: English
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      – SubjectFull: Electron cloud effect
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      – TitleFull: Surface science insight note: Charge compensation and charge correction in X‐ray photoelectron spectroscopy.
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              M: 08
              Text: Aug2024
              Type: published
              Y: 2024
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