High‐throughput and high‐resolution powder X‐ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample‐to‐detector distance and innovative automation system.
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| Title: | High‐throughput and high‐resolution powder X‐ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample‐to‐detector distance and innovative automation system. |
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| Authors: | Kawaguchi, Shogo1 (AUTHOR) kawaguchi@spring8.or.jp, Kobayashi, Shintaro1 (AUTHOR), Yamada, Hiroki1 (AUTHOR), Ashitani, Hirotaka1 (AUTHOR), Takemoto, Michitaka1 (AUTHOR), Imai, Yasuhiko1,2 (AUTHOR), Hatsui, Takaki1,2 (AUTHOR), Sugimoto, Kunihisa1 (AUTHOR), Sakata, Osami1 (AUTHOR) |
| Source: | Journal of Synchrotron Radiation. Jul2024, Vol. 31 Issue 4, p955-967. 13p. |
| Subjects: | X-ray diffractometers, X-ray powder diffraction, Distribution (Probability theory), Powders, Synchrotrons, Detectors |
| Abstract: | The demand for powder X‐ray diffraction analysis continues to increase in a variety of scientific fields, as the excellent beam quality of high‐brightness synchrotron light sources enables the acquisition of high‐quality measurement data with high intensity and angular resolution. Synchrotron powder diffraction has enabled the rapid measurement of many samples and various in situ/operando experiments in nonambient sample environments. To meet the demands for even higher throughput measurements using high‐energy X‐rays at SPring‐8, a high‐throughput and high‐resolution powder diffraction system has been developed. This system is combined with six sets of two‐dimensional (2D) CdTe detectors for high‐energy X‐rays, and various automation systems, including a system for automatic switching among large sample environmental equipment, have been developed in the third experimental hutch of the insertion device beamline BL13XU at SPring‐8. In this diffractometer system, high‐brilliance and high‐energy X‐rays ranging from 16 to 72 keV are available. The powder diffraction data measured under ambient and various nonambient conditions can be analysed using Rietveld refinement and the pair distribution function. Using the 2D CdTe detectors with variable sample‐to‐detector distance, three types of scan modes have been established: standard, single‐step and high‐resolution. A major feature is the ability to measure a whole powder pattern with millisecond resolution. Equally important, this system can measure powder diffraction data with high Q exceeding 30 Å−1 within several tens of seconds. This capability is expected to contribute significantly to new research avenues using machine learning and artificial intelligence by utilizing the large amount of data obtained from high‐throughput measurements. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
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| Header | DbId: egs DbLabel: Engineering Source An: 178297665 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: High‐throughput and high‐resolution powder X‐ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample‐to‐detector distance and innovative automation system. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Kawaguchi%2C+Shogo%22">Kawaguchi, Shogo</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> kawaguchi@spring8.or.jp</i><br /><searchLink fieldCode="AR" term="%22Kobayashi%2C+Shintaro%22">Kobayashi, Shintaro</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yamada%2C+Hiroki%22">Yamada, Hiroki</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Ashitani%2C+Hirotaka%22">Ashitani, Hirotaka</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Takemoto%2C+Michitaka%22">Takemoto, Michitaka</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Imai%2C+Yasuhiko%22">Imai, Yasuhiko</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hatsui%2C+Takaki%22">Hatsui, Takaki</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sugimoto%2C+Kunihisa%22">Sugimoto, Kunihisa</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Sakata%2C+Osami%22">Sakata, Osami</searchLink><relatesTo>1</relatesTo> (AUTHOR) – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Synchrotron+Radiation%22">Journal of Synchrotron Radiation</searchLink>. Jul2024, Vol. 31 Issue 4, p955-967. 13p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22X-ray+diffractometers%22">X-ray diffractometers</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+powder+diffraction%22">X-ray powder diffraction</searchLink><br /><searchLink fieldCode="DE" term="%22Distribution+%28Probability+theory%29%22">Distribution (Probability theory)</searchLink><br /><searchLink fieldCode="DE" term="%22Powders%22">Powders</searchLink><br /><searchLink fieldCode="DE" term="%22Synchrotrons%22">Synchrotrons</searchLink><br /><searchLink fieldCode="DE" term="%22Detectors%22">Detectors</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The demand for powder X‐ray diffraction analysis continues to increase in a variety of scientific fields, as the excellent beam quality of high‐brightness synchrotron light sources enables the acquisition of high‐quality measurement data with high intensity and angular resolution. Synchrotron powder diffraction has enabled the rapid measurement of many samples and various in situ/operando experiments in nonambient sample environments. To meet the demands for even higher throughput measurements using high‐energy X‐rays at SPring‐8, a high‐throughput and high‐resolution powder diffraction system has been developed. This system is combined with six sets of two‐dimensional (2D) CdTe detectors for high‐energy X‐rays, and various automation systems, including a system for automatic switching among large sample environmental equipment, have been developed in the third experimental hutch of the insertion device beamline BL13XU at SPring‐8. In this diffractometer system, high‐brilliance and high‐energy X‐rays ranging from 16 to 72 keV are available. The powder diffraction data measured under ambient and various nonambient conditions can be analysed using Rietveld refinement and the pair distribution function. Using the 2D CdTe detectors with variable sample‐to‐detector distance, three types of scan modes have been established: standard, single‐step and high‐resolution. A major feature is the ability to measure a whole powder pattern with millisecond resolution. Equally important, this system can measure powder diffraction data with high Q exceeding 30 Å−1 within several tens of seconds. This capability is expected to contribute significantly to new research avenues using machine learning and artificial intelligence by utilizing the large amount of data obtained from high‐throughput measurements. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1107/S1600577524003539 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 955 Subjects: – SubjectFull: X-ray diffractometers Type: general – SubjectFull: X-ray powder diffraction Type: general – SubjectFull: Distribution (Probability theory) Type: general – SubjectFull: Powders Type: general – SubjectFull: Synchrotrons Type: general – SubjectFull: Detectors Type: general Titles: – TitleFull: High‐throughput and high‐resolution powder X‐ray diffractometer consisting of six sets of 2D CdTe detectors with variable sample‐to‐detector distance and innovative automation system. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kawaguchi, Shogo – PersonEntity: Name: NameFull: Kobayashi, Shintaro – PersonEntity: Name: NameFull: Yamada, Hiroki – PersonEntity: Name: NameFull: Ashitani, Hirotaka – PersonEntity: Name: NameFull: Takemoto, Michitaka – PersonEntity: Name: NameFull: Imai, Yasuhiko – PersonEntity: Name: NameFull: Hatsui, Takaki – PersonEntity: Name: NameFull: Sugimoto, Kunihisa – PersonEntity: Name: NameFull: Sakata, Osami IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 09090495 Numbering: – Type: volume Value: 31 – Type: issue Value: 4 Titles: – TitleFull: Journal of Synchrotron Radiation Type: main |
| ResultId | 1 |
