Characterization of NiCuO x N y Coatings Obtained via RF Sputtering: Structure, Morphology, and Optical Properties.

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Title: Characterization of NiCuO x N y Coatings Obtained via RF Sputtering: Structure, Morphology, and Optical Properties.
Authors: Velásquez-Méndez, Karen Lizzette1 (AUTHOR) klvelasquezm@unal.edu.co, Alfonso, José Edgar2 (AUTHOR) jealfonsoo@unal.edu.co, Bethencourt, Manuel3 (AUTHOR) gustavo.cifredo@uca.es, Cifredo, Gustavo3 (AUTHOR), Cubillos, Gloria Ivonne1 (AUTHOR) gcubillos@unal.edu.co
Source: Materials (1996-1944). Jul2024, Vol. 17 Issue 13, p3264. 17p.
Subjects: Radiofrequency sputtering, Rare earth metals, Optical properties, Thin films, X-ray photoelectron spectroscopy, Nitrogen, Atmospheric nitrogen
Abstract: The rapid advancement of technology necessitates the continual development of versatile materials that can adapt to new electronic devices. Rare earth elements, which are scarce in nature, possess the set of properties required for use as semiconductors. Consequently, this research aims to achieve similar properties using materials that are abundant in nature and have a low commercial cost. To this end, nickel and copper were utilized to synthesize thin films of nickel–copper binary oxynitride via reactive RF sputtering. The influence of nitrogen flow on the structure, morphology, chemical composition, and optical properties of the films was investigated using various characterization techniques, including X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS), as well as transmittance and absorbance measurements. The crystalline structure of the films shows that they can have preferential growth or be polycrystalline according to the nitrogen flow used during deposition and that both the oxides and oxynitrides of metals are formed. We identified unknown phases specific to this material, termed "NiCuOxNy". The morphology revealed that the grain size of the coatings was dependent on the nitrogen flow rate, with grain size decreasing as the nitrogen flow rate increased. Notably, the coatings demonstrated transparency for wavelengths exceeding 1000 nm, with an optical band gap ranging from 1.21 to 1.86 eV. [ABSTRACT FROM AUTHOR]
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  Data: Characterization of NiCuO x N y Coatings Obtained via RF Sputtering: Structure, Morphology, and Optical Properties.
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  Data: <searchLink fieldCode="JN" term="%22Materials+%281996-1944%29%22">Materials (1996-1944)</searchLink>. Jul2024, Vol. 17 Issue 13, p3264. 17p.
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  Data: <searchLink fieldCode="DE" term="%22Radiofrequency+sputtering%22">Radiofrequency sputtering</searchLink><br /><searchLink fieldCode="DE" term="%22Rare+earth+metals%22">Rare earth metals</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+properties%22">Optical properties</searchLink><br /><searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+photoelectron+spectroscopy%22">X-ray photoelectron spectroscopy</searchLink><br /><searchLink fieldCode="DE" term="%22Nitrogen%22">Nitrogen</searchLink><br /><searchLink fieldCode="DE" term="%22Atmospheric+nitrogen%22">Atmospheric nitrogen</searchLink>
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  Data: The rapid advancement of technology necessitates the continual development of versatile materials that can adapt to new electronic devices. Rare earth elements, which are scarce in nature, possess the set of properties required for use as semiconductors. Consequently, this research aims to achieve similar properties using materials that are abundant in nature and have a low commercial cost. To this end, nickel and copper were utilized to synthesize thin films of nickel–copper binary oxynitride via reactive RF sputtering. The influence of nitrogen flow on the structure, morphology, chemical composition, and optical properties of the films was investigated using various characterization techniques, including X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS), as well as transmittance and absorbance measurements. The crystalline structure of the films shows that they can have preferential growth or be polycrystalline according to the nitrogen flow used during deposition and that both the oxides and oxynitrides of metals are formed. We identified unknown phases specific to this material, termed "NiCuOxNy". The morphology revealed that the grain size of the coatings was dependent on the nitrogen flow rate, with grain size decreasing as the nitrogen flow rate increased. Notably, the coatings demonstrated transparency for wavelengths exceeding 1000 nm, with an optical band gap ranging from 1.21 to 1.86 eV. [ABSTRACT FROM AUTHOR]
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  Label:
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  Data: <i>Copyright of Materials (1996-1944) is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.3390/ma17133264
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      – Code: eng
        Text: English
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        PageCount: 17
        StartPage: 3264
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      – SubjectFull: Radiofrequency sputtering
        Type: general
      – SubjectFull: Rare earth metals
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      – SubjectFull: Optical properties
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      – SubjectFull: Thin films
        Type: general
      – SubjectFull: X-ray photoelectron spectroscopy
        Type: general
      – SubjectFull: Nitrogen
        Type: general
      – SubjectFull: Atmospheric nitrogen
        Type: general
    Titles:
      – TitleFull: Characterization of NiCuO x N y Coatings Obtained via RF Sputtering: Structure, Morphology, and Optical Properties.
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            NameFull: Velásquez-Méndez, Karen Lizzette
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            NameFull: Alfonso, José Edgar
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            NameFull: Bethencourt, Manuel
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            – D: 01
              M: 07
              Text: Jul2024
              Type: published
              Y: 2024
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              Value: 17
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