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Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.

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Title: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
Authors: Liu, Fang1,2 (AUTHOR), Li, Ming1,2 (AUTHOR) lim@ihep.ac.cn, Diao, Qianshun1,2 (AUTHOR), Li, Zhe1 (AUTHOR), Shen, Zhibang1,2 (AUTHOR), Li, Fan3 (AUTHOR), Hong, Zhen1 (AUTHOR), Lian, Hongkai1 (AUTHOR), Yue, Shuaipeng1 (AUTHOR), Hou, Qingyan1 (AUTHOR), Zhang, Changrui1 (AUTHOR), Zhang, Dongni1,2 (AUTHOR), Li, Congcong1,2 (AUTHOR), Yang, Fugui1,2 (AUTHOR), Yang, Junliang1 (AUTHOR) yangjl@ihep.ac.cn
Source: Journal of Synchrotron Radiation. Sep2024, Vol. 31 Issue 5, p1146-1153. 8p.
Subjects: Synchrotron radiation sources, Synchrotron radiation, Crystal surfaces, Monochromators, Crystals
Abstract: Achieving diffraction‐limited performance in fourth‐generation synchrotron radiation sources demands monochromator crystals that can preserve the wavefront across an unprecedented extensive range. There is an urgent need for techniques of absolute crystal diffraction wavefront measurement. At the Beijing Synchrotron Radiation Facility (BSRF), a novel edge scan wavefront metrology technique has been developed. This technique employs a double‐edge tracking method, making diffraction‐limited level absolute crystal diffraction wavefront measurement a reality. The results demonstrate an equivalent diffraction surface slope error below 70 nrad (corresponding to a wavefront phase error of 4.57% λ) r.m.s. within a nearly 6 mm range for a flat crystal in the crystal surface coordinate. The double‐edge structure contributes to exceptional measurement precision for slope error reproducibility, achieving levels below 15 nrad (phase error reproducibility < λ/100) even at a first‐generation synchrotron radiation source. Currently, the measurement termed double‐edge scan (DES) has already been regarded as a critical feedback mechanism in the fabrication of next‐generation crystals. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
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  Data: &lt;searchLink fieldCode=&quot;JN&quot; term=&quot;%22Journal+of+Synchrotron+Radiation%22&quot;&gt;Journal of Synchrotron Radiation&lt;/searchLink&gt;. Sep2024, Vol. 31 Issue 5, p1146-1153. 8p.
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  Data: Achieving diffraction‐limited performance in fourth‐generation synchrotron radiation sources demands monochromator crystals that can preserve the wavefront across an unprecedented extensive range. There is an urgent need for techniques of absolute crystal diffraction wavefront measurement. At the Beijing Synchrotron Radiation Facility (BSRF), a novel edge scan wavefront metrology technique has been developed. This technique employs a double‐edge tracking method, making diffraction‐limited level absolute crystal diffraction wavefront measurement a reality. The results demonstrate an equivalent diffraction surface slope error below 70 nrad (corresponding to a wavefront phase error of 4.57% λ) r.m.s. within a nearly 6 mm range for a flat crystal in the crystal surface coordinate. The double‐edge structure contributes to exceptional measurement precision for slope error reproducibility, achieving levels below 15 nrad (phase error reproducibility &lt; λ/100) even at a first‐generation synchrotron radiation source. Currently, the measurement termed double‐edge scan (DES) has already been regarded as a critical feedback mechanism in the fabrication of next‐generation crystals. [ABSTRACT FROM AUTHOR]
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  Data: &lt;i&gt;Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites without the copyright holder&#39;s express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.&lt;/i&gt; (Copyright applies to all Abstracts.)
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RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1107/S1600577524006222
    Languages:
      – Code: eng
        Text: English
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      Pagination:
        PageCount: 8
        StartPage: 1146
    Subjects:
      – SubjectFull: Synchrotron radiation sources
        Type: general
      – SubjectFull: Synchrotron radiation
        Type: general
      – SubjectFull: Crystal surfaces
        Type: general
      – SubjectFull: Monochromators
        Type: general
      – SubjectFull: Crystals
        Type: general
    Titles:
      – TitleFull: Double‐edge scan wavefront metrology and its application in crystal diffraction wavefront measurements.
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            – D: 01
              M: 09
              Text: Sep2024
              Type: published
              Y: 2024
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