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Fast Numerical Calculation of X-Ray Diffraction from Crystal Microsystems.

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Title: Fast Numerical Calculation of X-Ray Diffraction from Crystal Microsystems.
Authors: Punegov, V. I.1 (AUTHOR) vpunegov@dm.komisc.ru, Malkov, D. M.1 (AUTHOR)
Source: Crystallography Reports. Aug2024, Vol. 69 Issue 4, p466-470. 5p.
Subjects: Numerical calculations, Crystal models, X-ray diffraction, Computer simulation, X-rays
Abstract: In the kinematical approximation, a method for rapid numerical calculation of X-ray diffraction from thin crystalline microsystems has been developed. The speed of calculating of reciprocal space maps using this approach is three to four orders of magnitude higher than calculations based on the Takagi–Taupin equations or two-dimensional recurrence relations. Within the framework of the obtained solutions, numerical simulation of X-ray reciprocal space mapping was performed for three models of crystal chips of microsystems. [ABSTRACT FROM AUTHOR]
Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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  Data: Fast Numerical Calculation of X-Ray Diffraction from Crystal Microsystems.
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  Data: In the kinematical approximation, a method for rapid numerical calculation of X-ray diffraction from thin crystalline microsystems has been developed. The speed of calculating of reciprocal space maps using this approach is three to four orders of magnitude higher than calculations based on the Takagi–Taupin equations or two-dimensional recurrence relations. Within the framework of the obtained solutions, numerical simulation of X-ray reciprocal space mapping was performed for three models of crystal chips of microsystems. [ABSTRACT FROM AUTHOR]
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  Data: <i>Copyright of Crystallography Reports is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Text: English
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      – SubjectFull: X-ray diffraction
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      – SubjectFull: Computer simulation
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              Text: Aug2024
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