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Title: INTERNATIONAL DIARY.
Source: Insight: Non-Destructive Testing & Condition Monitoring. Oct2024, Vol. 66 Issue 10, p639-641. 3p.
Subjects: Computed tomography, Metals testing, X-ray computed microtomography, Phase detectors, Nondestructive testing
Abstract: The document provides a comprehensive list of international conferences and events related to non-destructive testing and condition monitoring in various industries. It includes details such as dates, locations, and topics covered at each event. The conferences aim to advance research, innovation, and collaboration in the field of X-ray computed tomography, NDT, and NDE. The document also highlights key speakers, presentations, and networking opportunities available at these events. [Extracted from the article]
Copyright of Insight: Non-Destructive Testing & Condition Monitoring is the property of British Institute of Non-Destructive Testing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Engineering Source
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DbLabel: Engineering Source
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PubType: Academic Journal
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  Data: INTERNATIONAL DIARY.
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  Data: <searchLink fieldCode="JN" term="%22Insight%3A+Non-Destructive+Testing+%26+Condition+Monitoring%22">Insight: Non-Destructive Testing & Condition Monitoring</searchLink>. Oct2024, Vol. 66 Issue 10, p639-641. 3p.
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  Data: <searchLink fieldCode="DE" term="%22Computed+tomography%22">Computed tomography</searchLink><br /><searchLink fieldCode="DE" term="%22Metals+testing%22">Metals testing</searchLink><br /><searchLink fieldCode="DE" term="%22X-ray+computed+microtomography%22">X-ray computed microtomography</searchLink><br /><searchLink fieldCode="DE" term="%22Phase+detectors%22">Phase detectors</searchLink><br /><searchLink fieldCode="DE" term="%22Nondestructive+testing%22">Nondestructive testing</searchLink>
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  Data: The document provides a comprehensive list of international conferences and events related to non-destructive testing and condition monitoring in various industries. It includes details such as dates, locations, and topics covered at each event. The conferences aim to advance research, innovation, and collaboration in the field of X-ray computed tomography, NDT, and NDE. The document also highlights key speakers, presentations, and networking opportunities available at these events. [Extracted from the article]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Insight: Non-Destructive Testing & Condition Monitoring is the property of British Institute of Non-Destructive Testing and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 639
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      – SubjectFull: Computed tomography
        Type: general
      – SubjectFull: Metals testing
        Type: general
      – SubjectFull: X-ray computed microtomography
        Type: general
      – SubjectFull: Phase detectors
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      – SubjectFull: Nondestructive testing
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              M: 10
              Text: Oct2024
              Type: published
              Y: 2024
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