APA (7th ed.) Citation

Lei, P., Chang, Q., Xiao, M., Ye, C., Qi, P., Shi, F., . . . Peng, Q. (2024). Microstructure Evolution of the Interface in SiC f /TiC-Ti 3 SiC 2 Composite under Sequential Xe-He-H Ion Irradiation and Annealing Process. Nanomaterials (2079-4991), 14(20), 1629. https://doi.org/10.3390/nano14201629

Chicago Style (17th ed.) Citation

Lei, Penghui, Qing Chang, Mingkun Xiao, Chao Ye, Pan Qi, Fangjie Shi, Yuhua Hang, Qianwu Li, and Qing Peng. "Microstructure Evolution of the Interface in SiC F /TiC-Ti 3 SiC 2 Composite Under Sequential Xe-He-H Ion Irradiation and Annealing Process." Nanomaterials (2079-4991) 14, no. 20 (2024): 1629. https://doi.org/10.3390/nano14201629.

MLA (9th ed.) Citation

Lei, Penghui, et al. "Microstructure Evolution of the Interface in SiC F /TiC-Ti 3 SiC 2 Composite Under Sequential Xe-He-H Ion Irradiation and Annealing Process." Nanomaterials (2079-4991), vol. 14, no. 20, 2024, p. 1629, https://doi.org/10.3390/nano14201629.