Methods of Measurements of Electromagnetic Characterization of Free Space Materials in the X-Band.
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| Title: | Methods of Measurements of Electromagnetic Characterization of Free Space Materials in the X-Band. |
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| Authors: | Passos, Rafaela Real1,2 rcreall@yahoo.com.br, Corsato, Cecília Maia1 ceciliacorsato@hotmail.com, Donati, Bruno Ferraz1 brunofdonati@gmail.com, Fonseca, Nicholas Eras1 nicoeras@hotmail.com, da Silva, Valdirene Aparecida1,3 valapsilva@yahoo.com.br |
| Source: | Journal of Microwaves, Optoelectronics & Electromagnetic Applications. 2024, Vol. 23 Issue 3, p1-16. 16p. |
| Subjects: | Horn antennas, Transmitting antennas, Electromagnetic measurements, Directional antennas, Receiving antennas, Anechoic chambers |
| Abstract: | The technique of electromagnetic characterization of materials in free space allows for the measurement of constitutive properties without making contact with the material being measured. Characterization methods in Free Space are naturally suited for Electromagnetic Radiation Absorbing Materials (RAM) but are also important in applications where the material sample to be measured does not undergo major interventions. They consist of evaluating a received signal resulting from a free-space transmission through two horn antennas with beam collimating lenses and a Vector Network Analyzer (VNA). The characteristics of the transmitted signal are modified by a material positioned between the transmitting and receiving antennas. This work presents methods for electromagnetic characterization in Free Space, in the frequency range of 8.2 to 12.4 GHz (X-Band), in a semi-anechoic chamber, seeking the development of measurement processes that present results with repeatability and reliability. The measurements were made with standard and electromagnetic radiation absorbing materials. The measurement technique presented 95% of efficiency. [ABSTRACT FROM AUTHOR] |
| Copyright of Journal of Microwaves, Optoelectronics & Electromagnetic Applications is the property of Brazilian Microwave & Optoelectronics Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) | |
| Database: | Engineering Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: egs DbLabel: Engineering Source An: 180688234 AccessLevel: 6 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Methods of Measurements of Electromagnetic Characterization of Free Space Materials in the X-Band. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Passos%2C+Rafaela+Real%22">Passos, Rafaela Real</searchLink><relatesTo>1,2</relatesTo><i> rcreall@yahoo.com.br</i><br /><searchLink fieldCode="AR" term="%22Corsato%2C+Cecília+Maia%22">Corsato, Cecília Maia</searchLink><relatesTo>1</relatesTo><i> ceciliacorsato@hotmail.com</i><br /><searchLink fieldCode="AR" term="%22Donati%2C+Bruno+Ferraz%22">Donati, Bruno Ferraz</searchLink><relatesTo>1</relatesTo><i> brunofdonati@gmail.com</i><br /><searchLink fieldCode="AR" term="%22Fonseca%2C+Nicholas+Eras%22">Fonseca, Nicholas Eras</searchLink><relatesTo>1</relatesTo><i> nicoeras@hotmail.com</i><br /><searchLink fieldCode="AR" term="%22da+Silva%2C+Valdirene+Aparecida%22">da Silva, Valdirene Aparecida</searchLink><relatesTo>1,3</relatesTo><i> valapsilva@yahoo.com.br</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Microwaves%2C+Optoelectronics+%26+Electromagnetic+Applications%22">Journal of Microwaves, Optoelectronics & Electromagnetic Applications</searchLink>. 2024, Vol. 23 Issue 3, p1-16. 16p. – Name: Subject Label: Subjects Group: Su Data: <searchLink fieldCode="DE" term="%22Horn+antennas%22">Horn antennas</searchLink><br /><searchLink fieldCode="DE" term="%22Transmitting+antennas%22">Transmitting antennas</searchLink><br /><searchLink fieldCode="DE" term="%22Electromagnetic+measurements%22">Electromagnetic measurements</searchLink><br /><searchLink fieldCode="DE" term="%22Directional+antennas%22">Directional antennas</searchLink><br /><searchLink fieldCode="DE" term="%22Receiving+antennas%22">Receiving antennas</searchLink><br /><searchLink fieldCode="DE" term="%22Anechoic+chambers%22">Anechoic chambers</searchLink> – Name: Abstract Label: Abstract Group: Ab Data: The technique of electromagnetic characterization of materials in free space allows for the measurement of constitutive properties without making contact with the material being measured. Characterization methods in Free Space are naturally suited for Electromagnetic Radiation Absorbing Materials (RAM) but are also important in applications where the material sample to be measured does not undergo major interventions. They consist of evaluating a received signal resulting from a free-space transmission through two horn antennas with beam collimating lenses and a Vector Network Analyzer (VNA). The characteristics of the transmitted signal are modified by a material positioned between the transmitting and receiving antennas. This work presents methods for electromagnetic characterization in Free Space, in the frequency range of 8.2 to 12.4 GHz (X-Band), in a semi-anechoic chamber, seeking the development of measurement processes that present results with repeatability and reliability. The measurements were made with standard and electromagnetic radiation absorbing materials. The measurement technique presented 95% of efficiency. [ABSTRACT FROM AUTHOR] – Name: AbstractSuppliedCopyright Label: Group: Ab Data: <i>Copyright of Journal of Microwaves, Optoelectronics & Electromagnetic Applications is the property of Brazilian Microwave & Optoelectronics Society and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1590/2179-10742024v23i3280724 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 16 StartPage: 1 Subjects: – SubjectFull: Horn antennas Type: general – SubjectFull: Transmitting antennas Type: general – SubjectFull: Electromagnetic measurements Type: general – SubjectFull: Directional antennas Type: general – SubjectFull: Receiving antennas Type: general – SubjectFull: Anechoic chambers Type: general Titles: – TitleFull: Methods of Measurements of Electromagnetic Characterization of Free Space Materials in the X-Band. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Passos, Rafaela Real – PersonEntity: Name: NameFull: Corsato, Cecília Maia – PersonEntity: Name: NameFull: Donati, Bruno Ferraz – PersonEntity: Name: NameFull: Fonseca, Nicholas Eras – PersonEntity: Name: NameFull: da Silva, Valdirene Aparecida IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 09 Text: 2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 21791074 Numbering: – Type: volume Value: 23 – Type: issue Value: 3 Titles: – TitleFull: Journal of Microwaves, Optoelectronics & Electromagnetic Applications Type: main |
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