APA (7th ed.) Citation

Frau, E., Sam-Giao, D., Kerlain, A., & Brylinski, C. (2024). Characterization of Ohmic Metal/Hg1−xCdxTe Contacts for Infrared Detection. Journal of Electronic Materials, 53(12), 8098. https://doi.org/10.1007/s11664-024-11295-3

Chicago Style (17th ed.) Citation

Frau, Elise, Diane Sam-Giao, Alexandre Kerlain, and Christian Brylinski. "Characterization of Ohmic Metal/Hg1−xCdxTe Contacts for Infrared Detection." Journal of Electronic Materials 53, no. 12 (2024): 8098. https://doi.org/10.1007/s11664-024-11295-3.

MLA (9th ed.) Citation

Frau, Elise, et al. "Characterization of Ohmic Metal/Hg1−xCdxTe Contacts for Infrared Detection." Journal of Electronic Materials, vol. 53, no. 12, 2024, p. 8098, https://doi.org/10.1007/s11664-024-11295-3.