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Photoluminescence Characteristics of Post-annealed Cu2O Thin Films.

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Title: Photoluminescence Characteristics of Post-annealed Cu2O Thin Films.
Authors: Chia, Chin-Hau1 (AUTHOR) chchia@nuk.edu.tw, Su, Shih-Hao1 (AUTHOR), Hu, Yu-Min1 (AUTHOR), Chiou, Jau-Wern1 (AUTHOR), Yu, Chin-Chung1 (AUTHOR), Jian, Sheng-Rui1,2 (AUTHOR)
Source: Journal of Electronic Materials. Dec2024, Vol. 53 Issue 12, p7261-7270. 10p.
Subjects: Thin films, Cuprous oxide, Partial pressure, Low temperatures, Exciton theory, Magnetron sputtering
Abstract: Cuprous oxide (Cu2O) thin films grown by radio-frequency magnetron sputtering were post-annealed at 700°C under various oxygen partial pressures (PO2). Reduction and oxidation of oxygen were found in thin films annealed under PO2 of 0.1 Pa and 2.0 Pa, respectively. We investigated the photoluminescence characteristics of the Cu2O thin films measured at low temperature (30 K) and room temperature (300 K). When post-annealed at PO2 of 0.3 Pa and 0.7 Pa, Cu2O films presented dominant PL lines originating from transitions of excitons and doubly charged oxygen vacancies at low temperature, and solely excitonic recombination at room temperature. The temperature-dependent exciton spectra were well modeled in terms of phonon-assisted recombination of ortho-excitons. On the other hand, a broad luminescence band around 2.2 eV dominated in oxygen-deficient and over-oxidized Cu2O thin films. By comparing the results of grazing-incident x-ray diffraction and luminescence spectra, we believe that the origin of this band, however, involves extrinsic bands induced by structural imperfections. [ABSTRACT FROM AUTHOR]
Copyright of Journal of Electronic Materials is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
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DbLabel: Engineering Source
An: 180990513
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PubTypeId: academicJournal
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  Label: Title
  Group: Ti
  Data: Photoluminescence Characteristics of Post-annealed Cu<subscript>2</subscript>O Thin Films.
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  Data: <searchLink fieldCode="AR" term="%22Chia%2C+Chin-Hau%22">Chia, Chin-Hau</searchLink><relatesTo>1</relatesTo> (AUTHOR)<i> chchia@nuk.edu.tw</i><br /><searchLink fieldCode="AR" term="%22Su%2C+Shih-Hao%22">Su, Shih-Hao</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Hu%2C+Yu-Min%22">Hu, Yu-Min</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Chiou%2C+Jau-Wern%22">Chiou, Jau-Wern</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Yu%2C+Chin-Chung%22">Yu, Chin-Chung</searchLink><relatesTo>1</relatesTo> (AUTHOR)<br /><searchLink fieldCode="AR" term="%22Jian%2C+Sheng-Rui%22">Jian, Sheng-Rui</searchLink><relatesTo>1,2</relatesTo> (AUTHOR)
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>. Dec2024, Vol. 53 Issue 12, p7261-7270. 10p.
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  Data: <searchLink fieldCode="DE" term="%22Thin+films%22">Thin films</searchLink><br /><searchLink fieldCode="DE" term="%22Cuprous+oxide%22">Cuprous oxide</searchLink><br /><searchLink fieldCode="DE" term="%22Partial+pressure%22">Partial pressure</searchLink><br /><searchLink fieldCode="DE" term="%22Low+temperatures%22">Low temperatures</searchLink><br /><searchLink fieldCode="DE" term="%22Exciton+theory%22">Exciton theory</searchLink><br /><searchLink fieldCode="DE" term="%22Magnetron+sputtering%22">Magnetron sputtering</searchLink>
– Name: Abstract
  Label: Abstract
  Group: Ab
  Data: Cuprous oxide (Cu2O) thin films grown by radio-frequency magnetron sputtering were post-annealed at 700°C under various oxygen partial pressures (PO2). Reduction and oxidation of oxygen were found in thin films annealed under PO2 of 0.1 Pa and 2.0 Pa, respectively. We investigated the photoluminescence characteristics of the Cu2O thin films measured at low temperature (30 K) and room temperature (300 K). When post-annealed at PO2 of 0.3 Pa and 0.7 Pa, Cu2O films presented dominant PL lines originating from transitions of excitons and doubly charged oxygen vacancies at low temperature, and solely excitonic recombination at room temperature. The temperature-dependent exciton spectra were well modeled in terms of phonon-assisted recombination of ortho-excitons. On the other hand, a broad luminescence band around 2.2 eV dominated in oxygen-deficient and over-oxidized Cu2O thin films. By comparing the results of grazing-incident x-ray diffraction and luminescence spectra, we believe that the origin of this band, however, involves extrinsic bands induced by structural imperfections. [ABSTRACT FROM AUTHOR]
– Name: AbstractSuppliedCopyright
  Label:
  Group: Ab
  Data: <i>Copyright of Journal of Electronic Materials is the property of Springer Nature and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.1007/s11664-024-11416-y
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      – Code: eng
        Text: English
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        PageCount: 10
        StartPage: 7261
    Subjects:
      – SubjectFull: Thin films
        Type: general
      – SubjectFull: Cuprous oxide
        Type: general
      – SubjectFull: Partial pressure
        Type: general
      – SubjectFull: Low temperatures
        Type: general
      – SubjectFull: Exciton theory
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      – SubjectFull: Magnetron sputtering
        Type: general
    Titles:
      – TitleFull: Photoluminescence Characteristics of Post-annealed Cu2O Thin Films.
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            NameFull: Chia, Chin-Hau
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            NameFull: Su, Shih-Hao
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            NameFull: Hu, Yu-Min
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            NameFull: Yu, Chin-Chung
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            – D: 01
              M: 12
              Text: Dec2024
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              Y: 2024
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